2013
DOI: 10.1016/j.jcrysgro.2013.06.005
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Analysis of self-lift-off process during HVPE growth of GaN on MOCVD-GaN/sapphire substrates with photolitographically patterned Ti mask

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Cited by 24 publications
(10 citation statements)
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“…Typical time of such crystallization run varies from 8 to 10 hours. Due to self-separation from the sapphire, a 2-inch free standing HVPE-GaN crystal can be obtained 15 . On the other hand, FS HVPE-GaN can be also obtained by using ammonothermally grown GaN as seed (Am-GaN) 16 .…”
Section: Methodsmentioning
confidence: 99%
“…Typical time of such crystallization run varies from 8 to 10 hours. Due to self-separation from the sapphire, a 2-inch free standing HVPE-GaN crystal can be obtained 15 . On the other hand, FS HVPE-GaN can be also obtained by using ammonothermally grown GaN as seed (Am-GaN) 16 .…”
Section: Methodsmentioning
confidence: 99%
“…[37][38][39]. Free-standing (F-S) HVPE-GaN crystals that are 2 inches and up to 1 mm thick are obtained using MOCVD-GaN/sapphire templates as seeds; for details, see Refs.…”
Section: Hvpe-gan Seedsmentioning
confidence: 99%
“…The high process temperature, together with the chemically aggressive substances involved in the HVPE process, makes the design of the reactor a challenging task. Gallium, ammonia, and hydrogen chloride react to some extent with most heat-resistant materials, including quartz, often used in HVPE reactor design [5][6][7][8][9][10][11][12][13][14][15], which leads to degradation of reactor parts and unintended doping of the grown crystal. The exclusion of quartz from the hot zone of the reactor is known to reduce the level of unintentional doping significantly [1,16].…”
Section: Introductionmentioning
confidence: 99%