2011
DOI: 10.1063/1.3564894
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Analysis of interband, intraband, and plasmon polariton transitions in silver nanoparticle films via in situ real-time spectroscopic ellipsometry

Abstract: Articles you may be interested in Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry Appl.

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Cited by 16 publications
(9 citation statements)
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“…Beyond a 4 nm nominal thickness, the thickness slightly decreases and remains constant in the nominal thickness range of 6 nm-17 nm. This behaviour was observed by Little et al, 22 and indicates that the film grows in a Volmer-Weber mode. [23][24][25] Adatoms migrate on the surface until they nucleate on other adatoms resulting in the formation of Ag islands (Fig.…”
Section: Discussionsupporting
confidence: 74%
“…Beyond a 4 nm nominal thickness, the thickness slightly decreases and remains constant in the nominal thickness range of 6 nm-17 nm. This behaviour was observed by Little et al, 22 and indicates that the film grows in a Volmer-Weber mode. [23][24][25] Adatoms migrate on the surface until they nucleate on other adatoms resulting in the formation of Ag islands (Fig.…”
Section: Discussionsupporting
confidence: 74%
“…The conversion of measured VASE data to dielectric functions that accurately describe how the samples scatter incident illumination depends sensitively on the model used, but tremendous insight may be gleaned from reasonably simple, physically meaningful approximations. 21,22,24,37 Here we report a series of VASE and variable-angle Mueller matrix (VAMM) measurements on self-assembled irregular ensembles of truncated spherical gallium NPs grown by MBE on sapphire substrates whose size distribution was spatially characterized by scanning electron microscopy (SEM). We show that for the majority of samples fabricated a Lorentz oscillator model with a damping term inversely proportional to the NP diameter accurately reproduces the salient behaviors.…”
mentioning
confidence: 99%
“…The Lorentz oscillator influence disappears, establishing bulk-like optical response of silver with clear optical interband transitions of d-band electrons above *4 eV. It is worth noting that the deviation from the dielectric function of bulk silver is due to the uneven surface morphology and electron scattering at grain boundaries after sintering [37]. Figure 3a, b shows the reflectivity and absorption coefficient of pristine and sintered Ag NP films.…”
Section: Thermal and Optical Properties Of Ag Npsmentioning
confidence: 94%