Analysis of infinitely thin dielectric gratings with surface relief

Wakabayashi, Hitoshi; Yamakita, Jiro; Matsumoto, Keiji; Asai, Mitsuteru

doi:10.1002/(sici)1520-6432(199912)82:12<38::aid-ecjb5>3.0.co;2-0

Cited by 5 publications

(9 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This scheme is simple and most commonly used in the analysis of gratings with surface reliefs [e.g., Yamasaki et al, 1991;Wakabayashi et al, 1999].…”

Section: Numerical Resultsmentioning

confidence: 99%

“…1. An equal step size is used, so that the thickness d k ( k = 1, 2, ⋯, L ‐2) of each layer is This scheme is simple and most commonly used in the analysis of gratings with surface reliefs [e.g., Yamasaki et al , 1991; Wakabayashi et al , 1999].…”

Section: Numerical Resultsmentioning

confidence: 99%

“…In previous works [ Wakabayashi et al , 1997, 1999], thin metallic gratings in which thickness is a function of position were analyzed by defining metallic gratings as lossy dielectric gratings with large complex permittivity and thickness. The two‐dimensional scattering problem of metallic gratings has been considered using a combination of the Fourier series expansion method and the multilayered step method.…”

Section: Introductionmentioning

confidence: 99%

“…The derivation involves the use of spatial harmonic expansion of the flux densities D z and B z instead of the electromagnetic fields E z and H z normal to the surface profile of the approximated stratified grating, as the flux densities are continuous. To investigate the effectiveness of our method, the solutions are compared to those of the conventional method [ Wakabayashi et al , 1997, 1999].…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Improved convergence in the analysis of thin metallic gratings with thickness profiles

et al. 2003

Self Cite

View full text Add to dashboard Cite

.[1] A combination of the Fourier series expansion method and the multilayered step method is applied to analysis of the scattering problem by a thin metallic grating with a thickness profile. The extremely large permittivity profiles of metallic gratings may affect accuracy of calculations adversely. The convergence of the Fourier expansion method is improved using the spatial harmonics of flux densities instead of electromagnetic fields normal to the surface of a metallic grating. In using the multilayered step method, the scheme used to partition the grating region and the distribution function of dielectric constant within each layer are examined.

show abstract

“…This scheme is simple and most commonly used in the analysis of gratings with surface reliefs [e.g., Yamasaki et al, 1991;Wakabayashi et al, 1999].…”

Section: Numerical Resultsmentioning

confidence: 99%

Section: Numerical Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Improved convergence in the analysis of thin metallic gratings with thickness profiles

et al. 2003

Self Cite

View full text Add to dashboard Cite

show abstract

“…We analyze extremely thin thickness-profiled gratings around the radio wavelength by using spatial harmonic expansions of the electromagnetic fields and the multilayered step method, on the two-dimensional scattering problem when the incident plane is perpendicular to the grating groove. Comparing the results of extremely thin gratings with those of plane gratings when disregarding the thickness parameter in calculations, yields results for both that are not in good agreement with an increased number of space harmonics for small surface resistance, or small periodicity in the TM case [Wakabayashi et al, 1999]. Because, in the case of metallic conductors, the imaginary part of complex permittivity is very large at a radio wavelength, the electric field along the periodic direction exhibits discontinues.…”

Section: Introductionmentioning

confidence: 93%

Analysis of thickness‐profiled gratings for oblique incidence using approximate modeling by plane gratings with surface resistance

Wakabayashi

Yamakita

2009

Radio Science

Self Cite

View full text Add to dashboard Cite

[1] In this paper, we demonstrate that thickness-profiled metallic gratings placed in a conical mounting can be approximated by a plane grating with surface resistance as a function of the position parameter. As for the method of analysis of thickness-profiled metallic gratings, we apply the multilayered step method, in which the grating region is partitioned into a set of stratified layers having rectangular-profiled gratings, and the flux densities expansion approach. As for the method of analysis for plane gratings with a thickness of zero, a spectral Galerkin method based on the mixed form of current expansions in the spectral and spatial domains is applied to the resistive boundary condition. Both methods are formulated for the three-dimensional scattering problem by linearly and circularly polarized incidence. From a comparison of the numerical results of thickness-profiled and plane metallic gratings for oblique incidence, the limit of the thickness is investigated.Citation: Wakabayashi, H., and J. Yamakita (2009), Analysis of thickness-profiled gratings for oblique incidence using approximate modeling by plane gratings with surface resistance, Radio Sci., 44, RS5009,

show abstract

Commission B: Fields and Waves

Stone¹

2009

Review of Radio Science 1996-1999

View full text Add to dashboard Cite

Analysis of infinitely thin dielectric gratings with surface relief

Cited by 5 publications

References 4 publications

Improved convergence in the analysis of thin metallic gratings with thickness profiles

Improved convergence in the analysis of thin metallic gratings with thickness profiles

Analysis of thickness‐profiled gratings for oblique incidence using approximate modeling by plane gratings with surface resistance

Commission B: Fields and Waves

Contact Info

Product

Resources

About