Abstract:MSTRAm-An accurate determination of y(x)-integral appearing in Kane's expression for the density of states is presented. Expressions of this approach are compared with other existing approximations. Mock's model for total density of states is applied to illustrate possibilities of proposed derivations. An efficient algorithm for analyses of highly doped semiconductor material properties with Kane related models is introduced. Calculated dependence of pn product and screening length versus doping is given. The … Show more
“…As m,* is a function of temperature (T), doping concentration (N,? and Ge fraction (xGe) [6,7]], the magnitudes of Udeg and AEDOS,, depend on T, N i and xGe. eE,,, AED0,, and AEdeg+AEDos,, are presented on Fig.…”
Section: Minority Carrier Concentrationmentioning
confidence: 99%
“…1. The calculations are based on the model for m, " from [7]. As can be seen, AEdeg+AEDos,, is negative and its absolute magnitude increases rapidly with increasing doping concentration, increasing Ge fraction and decreasing temperature.…”
Abstract:The doping concentration in the base of npn SiGe HBTs operating at low temperatures should be high to prevent carrier freeze-out and to assure low base resistance. As a consequence, the majority carrier concentration in the base is determined with Fermi-Dirac statistics. The influence of Fermi-Dirac statistics on collector current of npn SiGe HBTs at low temperatures is analyzed in this work. It is shown that taking Fermi-Dirac statistics into account instead of Boltzmann statistics results in lower collector current. Therefore, Fermi-Dirac statistics should be taken into account for analysis and optimization of these devices. Analytical modelling of effects induced by consideration of Fermi-Dirac statistics is investigated. Based on proposed effective Ge-induced bandgap narrowing with approximately linear dependence on Ge fraction, the accurate analytical modelling of electron transport in degenerately doped base with trapezoidal Ge profile is presented for the first time.
“…As m,* is a function of temperature (T), doping concentration (N,? and Ge fraction (xGe) [6,7]], the magnitudes of Udeg and AEDOS,, depend on T, N i and xGe. eE,,, AED0,, and AEdeg+AEDos,, are presented on Fig.…”
Section: Minority Carrier Concentrationmentioning
confidence: 99%
“…1. The calculations are based on the model for m, " from [7]. As can be seen, AEdeg+AEDos,, is negative and its absolute magnitude increases rapidly with increasing doping concentration, increasing Ge fraction and decreasing temperature.…”
Abstract:The doping concentration in the base of npn SiGe HBTs operating at low temperatures should be high to prevent carrier freeze-out and to assure low base resistance. As a consequence, the majority carrier concentration in the base is determined with Fermi-Dirac statistics. The influence of Fermi-Dirac statistics on collector current of npn SiGe HBTs at low temperatures is analyzed in this work. It is shown that taking Fermi-Dirac statistics into account instead of Boltzmann statistics results in lower collector current. Therefore, Fermi-Dirac statistics should be taken into account for analysis and optimization of these devices. Analytical modelling of effects induced by consideration of Fermi-Dirac statistics is investigated. Based on proposed effective Ge-induced bandgap narrowing with approximately linear dependence on Ge fraction, the accurate analytical modelling of electron transport in degenerately doped base with trapezoidal Ge profile is presented for the first time.
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