[1991 Proceedings] 6th Mediterranean Electrotechnical Conference
DOI: 10.1109/melcon.1991.161787
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Analysis of heavily doped semiconductors

Abstract: MSTRAm-An accurate determination of y(x)-integral appearing in Kane's expression for the density of states is presented. Expressions of this approach are compared with other existing approximations. Mock's model for total density of states is applied to illustrate possibilities of proposed derivations. An efficient algorithm for analyses of highly doped semiconductor material properties with Kane related models is introduced. Calculated dependence of pn product and screening length versus doping is given. The … Show more

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“…As m,* is a function of temperature (T), doping concentration (N,? and Ge fraction (xGe) [6,7]], the magnitudes of Udeg and AEDOS,, depend on T, N i and xGe. eE,,, AED0,, and AEdeg+AEDos,, are presented on Fig.…”
Section: Minority Carrier Concentrationmentioning
confidence: 99%
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“…As m,* is a function of temperature (T), doping concentration (N,? and Ge fraction (xGe) [6,7]], the magnitudes of Udeg and AEDOS,, depend on T, N i and xGe. eE,,, AED0,, and AEdeg+AEDos,, are presented on Fig.…”
Section: Minority Carrier Concentrationmentioning
confidence: 99%
“…1. The calculations are based on the model for m, " from [7]. As can be seen, AEdeg+AEDos,, is negative and its absolute magnitude increases rapidly with increasing doping concentration, increasing Ge fraction and decreasing temperature.…”
Section: Minority Carrier Concentrationmentioning
confidence: 99%