“…thermal grooving, sintering, void evolution in microelectronic circuits and epitaxial growth; see e.g. Mullins (1957), Li, Zhao, and Gao (1999), Bower and Craft (1998), Fried and Gurtin (2003), Averbuch, Israeli, and Ravve (2003), and the references therein. Existence, uniqueness and stability results have been given by Elliott and Garcke (1997), Escher, Mayer, and Simonett (1998) and Escher, Garcke, and Ito (2003).…”