2014
DOI: 10.1088/1674-1056/23/2/020301
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Analysis of Cr atom focusing deposition properties in the double half Gaussian standing wave field

Abstract: The use of the dipole force on atoms is a new technology that is used to build nanostructures. In this way, a high quality standard nano-grating can be obtained. Based on the semi-classical model, the motion equation is investigated and the trajectories of atoms in double half Gaussian standing wave field are simulated. Compared with the Gaussian standing wave field, the double half Gaussian standing wave can well focus the Cr atoms. In order to obtain this kind of beam, a prism is designed and the experimenta… Show more

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Cited by 2 publications
(2 citation statements)
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“…In addition, λ /4 (106.4 nm), [10] λ /8 (53.2 nm) [11] pitch standards and hexagonal nanostructures [6] have been generated by light marks for neutral Cr atoms. Recently, a structured mirror array [12] has been designed for the twodimensional collimation of Cr beams. In addition, a double half Gaussian standing wave field [13] has also been generated for better deposition in an atom lithography experiment.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, λ /4 (106.4 nm), [10] λ /8 (53.2 nm) [11] pitch standards and hexagonal nanostructures [6] have been generated by light marks for neutral Cr atoms. Recently, a structured mirror array [12] has been designed for the twodimensional collimation of Cr beams. In addition, a double half Gaussian standing wave field [13] has also been generated for better deposition in an atom lithography experiment.…”
Section: Introductionmentioning
confidence: 99%
“…The detailed experimental setup in our laboratory was described in previous studies. [28][29][30][31] Figure 4 shows AFM images of the two-step laser-focused atomic depositions with rotation angles of 45°and 90°. As expected, a highly uniform rhombus array of dots was fabricated at the interlaced positions in both situations; the distance between each pair of parallel sides in the rhombus shape is expected to be 212.8 nm, determined by the half-wavelength of the laser.…”
mentioning
confidence: 99%