Abstract:Data retention Iifetime is an important specification for the long term durability of EPROM circuits. While most of the published EPROM data retention results are based on empirical data, this paper presents an analytical approach which can be used to quantify EPROM data retention lifetime based on the circuit implementation. Two types of EPROM circuits are analyzed-a single transistor EPROM cell as weil as a differential EPROM circuit. Using this new approach, the EPROM data retention performance is converted… Show more
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