2010
DOI: 10.1007/s00170-010-2588-4
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Analysis and control of micro-cantilever in dynamic mode AFM

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Cited by 15 publications
(9 citation statements)
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“…The procedure mentioned above is also related to the Riemann function method for integrating partial differential equations. Dynamic responses have been considered in the field of control of distributed systems and in elastodynamics in connection with vibrations and cracking problems [23][24][25][26].…”
Section: Advances In Mathematical Physicsmentioning
confidence: 99%
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“…The procedure mentioned above is also related to the Riemann function method for integrating partial differential equations. Dynamic responses have been considered in the field of control of distributed systems and in elastodynamics in connection with vibrations and cracking problems [23][24][25][26].…”
Section: Advances In Mathematical Physicsmentioning
confidence: 99%
“…There, the Green function was obtained by working with a solution basis that considers hyperbolic and trigonometric functions in the general solution. These functions depend upon simple roots of a complete quadratic polynomial due to the inclusion of a second derivative spatial term in (24). When the axial load is removed, the solution basis reduces to the one considered for particular cases of vibrating beams.…”
Section: Closed Form Of the Transfer Function For A Multispanmentioning
confidence: 99%
“…Atomic Force Microscopy (AFM) plays an important role in studying the surface topography of materials and measuring intermolecular forces [1][2][3]. Tapping Mode Atomic Force Microscopy (TMAFM) reduces sample destruction, in comparison to contact mode, and, as a result, is widely used for studying compliant materials such as polymers, biomaterials and semiconductors [2,4].…”
Section: Introductionmentioning
confidence: 99%
“…Atomic force microscopy (AFM), which has a cantilever with a sharp pyramidal or conical tip at the free end, is now widely used as a powerful technique for studying surface topography on an atomic scale (Chang et al, ; Korayem et al, ; Mazeran and Loubet, ). When a tip scans across a sample surface, it induces a dynamic interaction force between the tip and the sample surface.…”
Section: Introductionmentioning
confidence: 99%