2021
DOI: 10.1007/s12633-021-01462-0
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Analog/RF Performance of Triple Material Gate Stack-Graded Channel Double Gate-Junctionless Strained-silicon MOSFET with Fixed Charges

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Cited by 5 publications
(3 citation statements)
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“…All the notations are carried their usual meaning and calculated from [43][44][45][46]. Figure 11 analyses the comparison of f T with V fg for UAJDMDG, JDMDG and UAJDG structures.…”
Section: Resultsmentioning
confidence: 99%
“…All the notations are carried their usual meaning and calculated from [43][44][45][46]. Figure 11 analyses the comparison of f T with V fg for UAJDMDG, JDMDG and UAJDG structures.…”
Section: Resultsmentioning
confidence: 99%
“…This is because the performance and reliability of the device are degraded when hot electrons are injected between the gate and drain. Also, to minimize leakage current without significantly decreasing I on concentrations, the electric field strength close to the drain should be lowered to its smallest value [21].…”
Section: Introductionmentioning
confidence: 99%
“…These factors encompass distinct dielectrics 27 , gate length, gate oxide material, and gate oxide thickness 28 , along with considerations of the underlap effect 29 and vacancy defects 30 . Another avenue to enhance analog/RF performance involves the adoption of triple-material gates 31 . Nevertheless, there remains considerable room for further research to optimize analog/RF parameters, and the capability to interchange and fine-tune these parameters is crucial in analog circuit design to pinpoint the most suitable operating region.…”
mentioning
confidence: 99%