“…It is more difficult to diagnose soft faults than hard faults because the features of the soft fault cases of the CUT are not significant. In recent years, many methods such as the fault dictionary method [5,6], the neural network [7][8][9][10], fuzzy analysis [11,12], the FNLP method [13], the wavelet preprocessing [14], the test-point node selection [15] , PCA method [16] and the support vector machine algorithm [17][18][19] have been presented for fault diagnosis of analog circuits.…”