An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating

Hinder, Steven J.; Lowe, C. P.; Watts, John F.

doi:10.1016/j.porgcoat.2007.07.016

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Polymer Surface and Interface1

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Cited by 6 publications

(1 citation statement)

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“…TOF-SIMS using buckminsterfullerene (C 60 ) as the primary ion beam was applied for depth profiling of the outermost layers of poly(vinylidene difluoride)-based coil coatings and additive segregation in those coatings , . Evidence for the formation of three layers with different chemical composition were found.…”

Section: Polymer Surface and Interfacementioning

confidence: 99%

Mass Spectrometry of Synthetic Polymers

Weidner

Trimpin

2008

Anal. Chem.

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Section: Polymer Surface and Interfacementioning

confidence: 99%

Mass Spectrometry of Synthetic Polymers

Weidner

Trimpin

2008

Anal. Chem.

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Surface Analysis and Imaging Techniques

Mahoney

Weidner

2011

Mass Spectrometry in Polymer Chemistry

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Cross‐sectional high‐resolution microscopy of thin pretreatment layers on hot dip galvanized steel

Saarimaa¹,

Manni²,

Kauppinen³

et al. 2014

Surface & Interface Analysis

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Hexavalent chromium containing pretreatments and primers for coil coating are soon to be entirely prohibited, which sets new demands for Cr-free alternatives. Most of the presently used Cr-free pretreatment layers operate predominantly via barrier formation and adhesion promotion mechanisms and lack the self-healing effect typical for Cr 6+ -pretreatments. This sets new demands also for the formation and monitoring of these layers. The barrier thickness and chemical composition of Cr-free pretreatment layers on hot dip galvanized steel were studied using cross sections from broad ion beam (BIB) sample preparation and ultramicrotome cutting. BIB milling provided finely polished cross sections of pretreated samples. Film thicknesses of 20-50 nm were accurately determined for Cr-free pretreatments containing 4-10 mg Ti/m 2 using BIB milling and scanning electron microscopy imaging. Scanning transmission electron microscopy, integrated with aberration correctors and X-ray energy dispersive spectrometry, of an ultramicrotome cut pretreated and painted samples provided detailed chemical information. Metal complexes were detected close to the pretreatment/zinc interface, while the polymeric part of the pretreatment layer prevailed closer to paint.

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An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating

Cited by 6 publications

References 29 publications

Mass Spectrometry of Synthetic Polymers

Mass Spectrometry of Synthetic Polymers

Surface Analysis and Imaging Techniques

Cross‐sectional high‐resolution microscopy of thin pretreatment layers on hot dip galvanized steel

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