A novel sideband interrogation technique was proposed to measure the resonance difference between two Fabry-Perot interferometers. With this technique sub-nano static strain-resolution was demonstrated experimentally for the first time to the best of our knowledge.
IntroductionGeophysics research requires monitoring the earth's deformation continuously at locations as many as possible with a resolution on the order of nano-strains (nε) in static to low frequency region. Optical fiber sensors are very attractive for this field due to their unique advantages, especially small size and easy deployment. However, although they have achieved very high resolution even better than nε for dynamic sensing, such as hydrophones [1], optical fiber sensor are not so successful in the field of static strain sensing up to now. One main reason is that the dynamic sensing is self-referenced, but the static strain sensing involves the comparison with an extra reference which is usually a frequency-stabilized component or an identical sensor head but free of strain. In our previous work we have reported several realizations of nε-order static strain resolution sensors based on interrogation with narrow linewidth tunable laser sources [2,3]. Further enhancing the resolution of those sensors, however, requires higher wavelength accuracy during sweeping of the laser sources, which cannot be improved simply.In this work, we report a novel sideband interrogation technique to measure the resonance difference between a pair of fiber Fabry-Perot interferometers (FFPI) with extremely high resolution. With this technique, an ultra-high wavelength resolution corresponding to a static strain resolution down to 0.6 nε was demonstrated in experiments, and the measuring period is only a few seconds.