An iterative approach to remove the influence of light ray bending from micron-scale scattered light tomography

Hödemann, Siim; Valdmann, Andreas; Kiisk, V.

doi:10.1016/j.optlaseng.2016.11.003

Cited by 2 publications

(4 citation statements)

References 47 publications

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“…Due to a combination of experimental errors and errors introduced by reconstruction algorithms, perfect stress equilibrium does not occur. In the case of numerical simulations, we were able to determine the percentage of refraction‐induced errors . When dealing with experimental stress profiles, such an option is no longer available, because the exact stress profile is unknown.…”

Section: Resultsmentioning

confidence: 99%

“…In our previous report, we showed that in case of 45° incidence angle there is virtually no influence of light ray bending . While at this incidence angle, it is not possible to resolve the micron‐scale stresses near the surface, one can very accurately determine the case depth.…”

Section: Methodsmentioning

confidence: 94%

“…In our previous report, we showed that in case of 45° incidence angle there is virtually no influence of light ray bending. 18 While at this incidence angle, it is not possible to resolve the micron-scale stresses near the surface, one can very accurately determine the case depth. Hence, to solve the problem of shifting of depth coordinates, a complementary measurement with polariscope that uses 45° incidence angle was performed on the same glass sample.…”

Section: Methodsmentioning

confidence: 99%

“…In the case of numerical simulations, we were able to determine the percentage of refraction-induced errors. 18 When dealing with experimental stress profiles, such an option is no longer available, because the exact stress profile is unknown. Hence, equilibrium of the stresses is hence the only indicator to evaluate the validity of the measured stress profile.…”

Section: Equilibrium Of Stressesmentioning

confidence: 99%

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Measurement of stress build‐up of ion exchange strengthened lithium aluminosilicate glass

Hödemann

Valdmann

Paemurru³

et al. 2019

J Am Ceram Soc

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A recently developed nondestructive method was used to investigate the stress buildup in chemically strengthened lithium aluminosilicate glass. We utilized an updated version of the gradient scattered light method, which now enables more precise determination of the depth coordinates, recovering a more detailed stress profile around the knee. The main motivation of the work was to characterize and optimize the development of the knee-shaped breaking point in stress profile in lithium aluminosilicate glass prepared by the Saunders-Kubichan method of one-step strengthening in a mixture of KNO 3 +NaNO 3 molten salt bath. In the industry, a two-step process is still commonly used to build such a stress profile; the one-step strengthening will simplify the process as well as save the cost. Compared to previous studies, which used a destructive method based on transmitted light photoelasticity, we found that in the samples ion exchanged for 24 hours, the knee-shaped breaking points were situated two times deeper whereas the case depths were 28% shallower. The measured stress profiles were validated by stress equilibrium and by comparison to Na + ion concentration profiles. K E Y W O R D S glass, ion exchange, polarization, refractive index, scattering 2408 | HÖDEMANN Et Al. How to cite this article: Hödemann S, Valdmann A, Paemurru M, et al. Measurement of stress build-up of ion exchange strengthened lithium aluminosilicate glass.

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Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 94%

Section: Methodsmentioning

confidence: 99%

Section: Equilibrium Of Stressesmentioning

confidence: 99%

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