2014
DOI: 10.1088/0022-3727/47/21/215101
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An investigation into second harmonic generation by Si-rich SiNxthin films deposited by RF sputtering over a wide range of Si concentrations

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Cited by 35 publications
(20 citation statements)
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“…1). As the Si content increases (with the lower flow rate of NH 3 ), the transmittance threshold shifts towards shorter wavelengths in good agreement with previous studies [9]. The oscillatory behavior of the transmittance at longer wavelengths can be ascribed to interference between beams reflected at the interfaces of the SiN film.…”
supporting
confidence: 90%
See 1 more Smart Citation
“…1). As the Si content increases (with the lower flow rate of NH 3 ), the transmittance threshold shifts towards shorter wavelengths in good agreement with previous studies [9]. The oscillatory behavior of the transmittance at longer wavelengths can be ascribed to interference between beams reflected at the interfaces of the SiN film.…”
supporting
confidence: 90%
“…The problem can be overcome by poling [4,5], straining the material [3] or by using multilayer composites [6][7][8]. Unexpectedly, CMOS-compatible amorphous silicon nitride films (SiN) have been shown to possess a bulk second-order nonlinearity by measuring strong second-harmonic generation (SHG) from thin films [9][10][11]. Although the exact reason for this strong SHG response remains unclear, it is believed that the complicated composition, crystalline phase, and defects in the film during the deposition may be responsible [10,[12][13][14][15][16].…”
mentioning
confidence: 99%
“…The measured conversion efficiency corresponds to a high equivalent second-order susceptibility, χ ( eq 2) = 3.7±0.2 pm/V. Although highly Si-rich SiN thin films might be expected to yield a somewhat larger value as concluded from photoelectron spectroscopy ( χ ( eff 2) = 11.8 pm/V [25]), the second order susceptibility that we find is larger than in SiN thin films ( χ ( eff 2) = 2.5 pm/V [24]), is one order of magnitude larger than in stress-released Si 3 N 4 waveguides ( χ ( eff 2) = 0.3 pm/V [27]) and more than two orders of magnitude larger than in Si 3 N 4 ring resonators ( χ ( eff 2) < 0.04 pm/V) [26].…”
Section: Discussionmentioning
confidence: 90%
“…On the other hand, there have been four reports on second-order response in related amorphous SiN-type materials. Specifically, second-harmonic generation has been observed in SiN films (fabricated using plasma enhanced chemical vapor deposition [24] or fabricated with RF sputtering [25]), in Si 3 N 4 ring resonators (fabricated with plasma enhanced chemical vapor deposition at lower temperatures [26]) where the nanoscale structure of the waveguide breaks the inversion symmetry and modal phase matching is employed, and in Si 3 N 4 waveguides fabricated using stress release patterns [27] where, similar to our work, the coherent photogalvanic effect breaks the inversion symmetry. However, we find an equivalent secondorder response that is an order of magnitude larger.…”
Section: Introductionmentioning
confidence: 99%
“…At quasi-phase matching, we report a SHG efficiency comparable to that reported in SiN resonant structures [7], with the benefit of a wider bandwidth. Even higher conversion efficiencies are expected using Si-rich SiN, which exhibits χ (2) values ten times larger than the stoichiometric compound [13]. Phase matched SHG in SiN waveguides can then compete with conventional χ (2) materials, but with fairly easier onchip integration, and with the capability of dynamically and all-optically reconfigure the phase matching configuration.…”
Section: Resultsmentioning
confidence: 99%