An Improved Random Path Length Algorithm for p-i-n and Staircase Avalanche Photodiodes

Pilotto, A.; Palestri, Pierpaolo; Selmi, L.; Antonelli, M.; Arfelli, Fulvia; Biasiol, G.; Cautero, G.; Driussi, F.; Menk, R.H.; Steinhartova, T.

doi:10.1109/sispad.2018.8551751

Cited by 6 publications

(14 citation statements)

References 19 publications

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“…In [38] we have also shown that if different trials are run for pairs generated at the same position x and for each of them a gain m i is found, the RPL can be used to compute M = 〈m i 〉 and F 〈m 2 i 〉/M 2 providing exactly the same results as obtained with the numerical solution of Eqs 4-10.…”

Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 55%

“…In [38] we have shown that the RPL algorithm can be applied to any functional form of α(x, x′), focusing on the model in [25] (i.e., Eq. 16 plus Eq.…”

Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 99%

“…A similar methodology is used to describe the motion of holes. As described in [38], each time a carrier ionizes, the algorithm recursively simulates the motion of the electron and hole originated from the parent carrier, until they are collected by the contacts, then it goes back to the simulation of the parent carrier.…”

Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 99%

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Modeling Approaches for Gain, Noise and Time Response of Avalanche Photodiodes for X-Rays Detection

et al. 2022

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We report on a suite of modeling approaches for the optimization of Avalanche Photodiodes for X-rays detection. Gain and excess noise are computed efficiently using a non-local/history dependent model that has been validated against full-band Monte Carlo simulations. The (stochastic) response of the detector to photon pulses is computed using an improved Random-Path-Length algorithm. As case studies, we consider diodes consisting of AlGaAs/GaAs multi-layers with separated absorption and multiplication regions. A superlattice creating a staircase conduction band structure is employed in the multiplication region to keep the multiplication noise low. Gain and excess noise have been measured in devices fabricated with such structure and successfully compared with the developed models.

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Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 55%

“…In [38] we have shown that the RPL algorithm can be applied to any functional form of α(x, x′), focusing on the model in [25] (i.e., Eq. 16 plus Eq.…”

Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 99%

Section: Improved Random-path-length Algorithm For Time Response To S...mentioning

confidence: 99%

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Modeling Approaches for Gain, Noise and Time Response of Avalanche Photodiodes for X-Rays Detection

et al. 2022

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“…To assess the influence of the sequence of steps on the device bandwidth, we run calculations using the Random Path Length algorithm presented in [17], which is an improved version, consistent with the definition of effective field of Eq. 6, of the one initially proposed by [18], [19].…”

Section: Numerical Resultsmentioning

confidence: 99%

A New Expression for the Gain-Noise Relation of Single-Carrier Avalanche Photodiodes With Arbitrary Staircase Multiplication Regions

Pilotto

Palestri

Selmi

et al. 2019

IEEE Trans. Electron Devices

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We propose a simple expression to relate the total excess noise factor of a single carrier multiplication staircase avalanche photodiode to the excess noise factor and gain given by the individual conduction band discontinuities. The formula is valid when electron impact ionization dominates hole impact ionization; hence, it is especially suited for staircase APDs with In-rich multiplication regions, as opposed, for example, to GaAs/AlGaAs systems where hole ionization plays an important role. The formula has been verified by accurate means of numerical simulations based on a newly developed nonlocal history dependent impact ionization model.

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“…The drawback of an increased number of steps is the longer multiplication region and thus longer time response to single photon absorption. The Random Path Length (RPL) implementation of the EBHDM [21] describes the time evolution of the current pulse and can be used to determine the When considering X-ray spectroscopy as a relevant application, one should remind that the diode current is processed by a leaky integrator followed by an CR-RC shaper. The overall transfer function of the system is approxi-…”

Section: Time Responsementioning

confidence: 99%

Optimization of GaAs/AlGaAs staircase avalanche photodiodes accounting for both electron and hole impact ionization

Pilotto

Palestri

Selmi

et al. 2020

Solid-State Electronics

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An Improved Random Path Length Algorithm for p-i-n and Staircase Avalanche Photodiodes

Cited by 6 publications

References 19 publications

Modeling Approaches for Gain, Noise and Time Response of Avalanche Photodiodes for X-Rays Detection

Modeling Approaches for Gain, Noise and Time Response of Avalanche Photodiodes for X-Rays Detection

A New Expression for the Gain-Noise Relation of Single-Carrier Avalanche Photodiodes With Arbitrary Staircase Multiplication Regions

Optimization of GaAs/AlGaAs staircase avalanche photodiodes accounting for both electron and hole impact ionization

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