2002
DOI: 10.1109/ted.2002.1291850
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An experimental investigation on the nature of reverse current of silicon power pn-junctions

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Cited by 29 publications
(12 citation statements)
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“…At high junction temperatures, the surface depletion layer adjacent to the dielectric layer acts as a shunt for the reverse electrical current, which increases the reverse leakage current significantly. 40 The decrease of resistance in the reverse bias results in the decrease of breakdown voltage at elevated temperatures.…”
Section: I-v and C-v Characterizationmentioning
confidence: 99%
“…At high junction temperatures, the surface depletion layer adjacent to the dielectric layer acts as a shunt for the reverse electrical current, which increases the reverse leakage current significantly. 40 The decrease of resistance in the reverse bias results in the decrease of breakdown voltage at elevated temperatures.…”
Section: I-v and C-v Characterizationmentioning
confidence: 99%
“…For low reverse bias, the effect of generation current was ignored due to extremely low values. 6 Also, the intrinsic carrier concentration is a function of band gap energy, …”
mentioning
confidence: 99%
“…The two dashed lines in Fig.1, correspond to a voltage dependence like V R 1/3 and V R 1/4 . Voltage dependence of I R as V R 1/3 or V R 1/2 has been also found, when the surface component of I R is the dominant one, [2][3]. For fast switching diodes, dominance of the bulk component of I R is possible from room to high junction temperature, [3].…”
Section: Experimental Results Discussionmentioning
confidence: 85%