2017 IEEE Applied Power Electronics Conference and Exposition (APEC) 2017
DOI: 10.1109/apec.2017.7930948
|View full text |Cite
|
Sign up to set email alerts
|

An equivalent power test scheme for modular multilevel converters (MMCs)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
5
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
3
3

Relationship

0
6

Authors

Journals

citations
Cited by 18 publications
(6 citation statements)
references
References 8 publications
1
5
0
Order By: Relevance
“…It can be observed that the capacitor voltage is controlled to increase gradually from 0 V to 300 V in the start-up process. It consumes about 2.5 seconds in total in order to reach the steady state, which is pretty close to 2.7 seconds predicted by (8)- (11). From the zoom-in Fig.…”
Section: A Parameter Selection Examplesupporting
confidence: 80%
See 2 more Smart Citations
“…It can be observed that the capacitor voltage is controlled to increase gradually from 0 V to 300 V in the start-up process. It consumes about 2.5 seconds in total in order to reach the steady state, which is pretty close to 2.7 seconds predicted by (8)- (11). From the zoom-in Fig.…”
Section: A Parameter Selection Examplesupporting
confidence: 80%
“…Together with other main system parameters shown in Table III, the carrier frequency used for the capacitor voltage control can be determined. In the experiment, the voltage control should be able to effectively charge and discharge the capacitor by 5 V increase/decrease within 0.1 s or 5 fundamental cycles (which is adjustable) to stabilize its voltage at 300 V. According to (8)- (11), the minimum carrier frequency of the voltage stabilizer calculated is 1.5 kHz for the high switching frequency mission profile applications. When it comes to the low switching frequency mission profile, considering the existence of ineffective additional switching actions (such as for NLM) as mentioned in Section II-C, longer time will be taken to charge or discharge the capacitor in this case.…”
Section: A Parameter Selection Examplementioning
confidence: 99%
See 1 more Smart Citation
“…In the prior-art studies, sub-module (SM) based test setups focus mainly on the electrical behavior emulation. An equivalent test scheme in [6] utilizes two SMs to emulate the electrical features of SMs (e.g., the SM capacitor voltage and the arm current). Based on the resonant test circuit proposed in [7] and control of the MMC can be conducted.…”
Section: Introductionmentioning
confidence: 99%
“…For the test bench in [10], series-connected IGBTs have to be used when applying the testing to Device Under test (DUT) rated at higher than 2 kV to fulfill the highvoltage requirement. The test bench in [6] has to increase the switching frequency in order to achieve a smooth arm current, but scarifies its thermal performance of the MMC with a low switching frequency in the field. The resonant test circuit in…”
Section: Introductionmentioning
confidence: 99%