Abstract:Reliability characterization is the industrial process intended to measure the useful life period and failure rate of a component population by exploiting stress mechanisms.The paper describes a methodology for the automatic generation of stress programs to be used during the reliability characterization process of Systems-on-Chip (SoC). The proposed methodology is composed of a twophase strategy; first an evolutionary algorithm (EA) works on the SoC's description at Register-Transfer-Level (RTL) by evaluating… Show more
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