An ellipsoidal mirror display analyzer system for electron energy and angular measurements

The formation of the Schottky barrier at the V/Si interface

“…Over the past few years, a number of investigations have revealed important aspects of the overall interface behavior, particularly for near-noble metals which form sUicide compounds. 1 -5 ji Synchrotron radiation from the 240 MeV Tantalus-I electron storage ring at the University of Wisconsin-Madison was used with a UHV toroidal grating monochromator and a display-type electron spectrometer 13 to measure angle-integrated hr-dependent photoemission spectra for the V/Si( 11) interface. The total instrumental energy resolution was !…”

Core Level Spectroscopy at Surfaces and Interfaces

“…In principle, it can be converted into an atom density, but there are many calibration faction to be taken into account [19]. By using a photoelectron spectrometer with exceptionally large angular acceptance (1.8 steradian [20]) one is able to average out most of the diffraction effects discussed in Sec. 3.2.…”

Photoelectron Diffraction and Synchrotron Radiation

“…Here, the high brilliance of synchrotron radiation, and associated with it the small illuminated spot size, are essential for proper performance of the electron optical system, and data acquisition times are greatly reduced. On the other hand, some of these designs suffer from very low signal-to-background ratios in the higher-energy regime and from energy-dependent angular distortions [15].…”

“…Recently, more complex analyzer systems have been designed, displaying either a full polar [13] or azimuthal [14] section or a large twodimensional solid angle range [15] of the photoelectron angular distribution. Here, the high brilliance of synchrotron radiation, and associated with it the small illuminated spot size, are essential for proper performance of the electron optical system, and data acquisition times are greatly reduced.…”