An electron Talbot interferometer

magnetic domains have been the subject of much scientific investigation since their theoretical existence was first postulated by P.-E. Weiss over a century ago. up to now, the threedimensional (3D) domain structure of bulk magnets has never been observed owing to the lack of appropriate experimental methods. Domain analysis in bulk matter thus remains one of the most challenging tasks in research on magnetic materials. All current domain observation methods are limited to studying surface domains or thin magnetic films. As the properties of magnetic materials are strongly affected by their domain structure, the development of a technique capable of investigating the shape, size and distribution of individual domains in three dimensions is of great importance. Here, we show that the novel technique of Talbot-Lau neutron tomography with inverted geometry enables direct imaging of the 3D network of magnetic domains within the bulk of Fesi crystals.

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“…The technique might also be combined with other imaging methods such as electron microscopy 19 or (soft) X-ray tomography.…”

Section: Discussionmentioning

confidence: 99%

Three-dimensional imaging of magnetic domains

et al. 2010

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“…This configuration is experimentally challenging to realize. Nevertheless, near field interferometry for matter waves does exist and may be pushed towards this regime [26,27]. In conclusion, phase difference predictions from the optical analogy and the path integral formalism will not agree in some near-field conditions.…”

Section: Phase Mattersmentioning

confidence: 95%

“…The necessary timing resolution on the energy measurement according to (26) would thus violate the Heisenberg uncertainty principle. Therefore, preserving phase coherence protects the inability to distinguish through which slit a particle will pass on its way …”

Section: The Heisenberg Uncertainty Principle and Path Measurementsmentioning

confidence: 99%

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Path integrals, matter waves, and the double slit

2015

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Basic explanations of the double slit diffraction phenomenon include a description of waves that emanate from two slits and interfere. The locations of the interference minima and maxima are determined by the phase difference of the waves. An optical wave, which has a wavelength l and propagates a distance L, accumulates a phase of L 2 . p l / A matter wave, also having wavelength l that propagates the same distance L, accumulates a phase of L , p l / which is a factor of two different from the optical case. Nevertheless, in most situations, the phase difference, , j D for interfering matter waves that propagate distances that differ by L, D is approximately L 2 , p l D / which is the same value computed in the optical case. The difference between the matter and optical case hinders conceptual explanations of diffraction from two slits based on the matter-optics analogy. In the following article we provide a path integral description for matter waves with a focus on conceptual explanation. A thought experiment is provided to illustrate the validity range of the approximation

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“…In principle, this approach had also been used already for light-optical wave front reconstructions of early off-axis electron holograms [29b]. Most recently, nanoscale gratings were used in an electron microscope to measure electron-surface interactions [30,31], image the electric field around a charged tip [32], and to precisely measure the wavefront curvature of an electron beam [33] among many other examples.…”

Section: Introductionmentioning

confidence: 99%

Aberration corrected STEM by means of diffraction gratings

Linck¹,

Ercius

Pierce

et al. 2017

Ultramicroscopy

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Abstract:In the past 15 years, the advent of aberration correction technology in electron microscopy has enabled materials analysis on the atomic scale. This is made possible by complex arrangements of multipole electrodes and magnetic solenoids to compensate the aberrations inherent to any focusing element of an electron microscope. Here, we describe an alternative method to correct for the spherical aberration of the objective lens in a scanning transmission electron microscopy (STEM) using a passive, nanofabricated diffractive optical element. This holographic device is installed in the probe forming aperture of a conventional electron microscope and can be designed to remove arbitrarily complex aberrations from the electron's wave front. In this work, we show a proof of principle experiment that demonstrates successful correction of the spherical aberration in STEM by means of such a grating corrector (GCOR). Our GCOR enables us to record aberration-corrected high-resolution HAADF STEM images, although yet without any improvement in probe current and resolution. Author Contact Information:Dr. Martin Linck, CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany

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An electron Talbot interferometer

Cited by 69 publications

References 31 publications

Three-dimensional imaging of magnetic domains

Three-dimensional imaging of magnetic domains

Path integrals, matter waves, and the double slit

Aberration corrected STEM by means of diffraction gratings

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