1995
DOI: 10.1116/1.588381
|View full text |Cite
|
Sign up to set email alerts
|

An electron-beam microcolumn with improved resolution, beam current, and stability

Abstract: Articles you may be interested inThree-dimensional electron-beam lithography using an all-dry resist processWe have built and tested a 1 keV electron-beam microcolumn that focuses 1 nA of beam current into a 10 nm full width half-maximum beam diameter at a working distance of 1 mm. The electron source is a miniaturized Zr/O/W Schottky field emitter with 150 A/sr angular emission current density operating at about 1800 K at a distance of only 100 m from a silicon membrane extractor electrode. The actual microco… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
10
0
2

Year Published

1999
1999
2013
2013

Publication Types

Select...
4
3
2

Relationship

0
9

Authors

Journals

citations
Cited by 59 publications
(14 citation statements)
references
References 2 publications
(2 reference statements)
0
10
0
2
Order By: Relevance
“…In addition, the low voltages within the column make it particularly amenable for use in microcolumn form, allowing the design of multiple beam writing systems. [8][9][10] Charge-induced pattern distortion is a potential issue associated with low-voltage electron beam lithography, [11][12][13] although many ways exist to circumvent this issue by imaging near the crossover energy, or by altering the crossover energy of a resist film through the use of additives.…”
Section: Motivation For Low-kev Electron Beam Exposure Toolsmentioning
confidence: 99%
“…In addition, the low voltages within the column make it particularly amenable for use in microcolumn form, allowing the design of multiple beam writing systems. [8][9][10] Charge-induced pattern distortion is a potential issue associated with low-voltage electron beam lithography, [11][12][13] although many ways exist to circumvent this issue by imaging near the crossover energy, or by altering the crossover energy of a resist film through the use of additives.…”
Section: Motivation For Low-kev Electron Beam Exposure Toolsmentioning
confidence: 99%
“…2®öB * ¶zj Îbº "; öB 7öBf îR&ae ï>Nf >N& B>, † E-mail: yckim@sunmoon.ac.kr * ¶ 2®~ V ¾¦~ae pº B Jº zî(coma) ¢ <º. V¢B .²; ¢"j Jêö ®ÚB ï>N¢ ²z , 2®ö ~ ' >»ö V *2 z~ çãj ² º © &. ¢^öBº ï>Nº BB ¢^~[ [3][4][5] 8¢ Ï~ semiconvergent angleö V *2 z~ ' j Ò~&. * ¶z~ * ¶f n;zB öB OÂ>î ~z¢ê * ¶ ö.ae 8~ ^ aez ~ ï>N& BB.…”
Section: ²; ¢ \unclassified
“…VB I 1 f ã ÒB¢ ^ ¾Jº C *~ * ¶ '" »Â *{(extractor voltage)" ãÒBö ~ Ö;B. * ¶ Ïò Î"¢ ~º « * ¶z~ çãj (4) â 2º "Úê *~ö &~ (4)¢ Ï~ semiconvergent angleö V z çãj Ö ©. semiconvergent angle α 1 66 öö V¢ z çãf 6²~ Ã&õ ãËj .…”
Section: ²; ¢ \unclassified
“…We compared two structural types of microcolumn. The first one is the conventional structure that composed of cathode, anode, extractor and limiter as illustrated in many other reports [8][9]. The other is the modified structure that has an additional electrode of subsidiary anode(S2s) between extractor and anode in the source lens.…”
Section: Introductionmentioning
confidence: 98%