An effective approach for functional test programs compaction

Touati, A.; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, P.; Reorda, M. Sonza

doi:10.1109/ddecs.2016.7482466

Cited by 7 publications

(2 citation statements)

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“…The method is shown to be effective on blocks like the arithmetic unit, but can only be applied under strict constraints and requires an ad-hoc simulator to perform the analysis. The method proposed in [34] deals with the special case in which multiple test programs are available, and selects the subset that minimizes the duration, while keeping the same global fault coverage. This work is among the first proposing a generic and fully automatic procedure for removing instructions from an existing test program to reduce its duration without reducing its fault coverage.…”

Section: Introductionmentioning

confidence: 99%

New Techniques to Reduce the Execution Time of Functional Test Programs

Gaudesi¹,

Pomeranz

Reorda

et al. 2017

IEEE Trans. Comput.

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The compaction of test programs for processor-based systems is of utmost practical importance: Software-Based Self-Test (SBST) is nowadays increasingly adopted, especially for in-field test of safety-critical applications, and both the size and the execution time of the test are critical parameters. However, while compacting the size of binary test sequences has been thoroughly studied over the years, the reduction of the execution time of test programs is still a rather unexplored area of research. This paper describes a family of algorithms able to automatically enhance an existing test program, reducing the time required to run it and, as a side effect, its size. The proposed solutions are based on instruction removal and restoration, which is shown to be computationally more efficient than instruction removal alone. Experimental results demonstrate the compaction capabilities, and allow analyzing computational costs and effectiveness of the different algorithms.

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Section: Introductionmentioning

confidence: 99%

New Techniques to Reduce the Execution Time of Functional Test Programs

Gaudesi¹,

Pomeranz

Reorda

et al. 2017

IEEE Trans. Comput.

View full text Add to dashboard Cite

show abstract

“…Refining the STL can be done in an iterative fashion, with as many cycles of code refinement and fault simulation as required until the desired coverage is achieved. If required, test engineers can finally apply some post-processing techniques to reduce the final STL size by removing redundant portions of code [30][31][32][33].…”

mentioning

confidence: 99%

A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers

et al. 2022

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In order to match the strict reliability requirements mandated by regulations and standards adopted in the automotive sector, as well as other domains where safety is a major concern, the in-field testing of the most critical devices, including microcontrollers and systems on chip, is a crucial task. Since the controller area network (CAN) bus is widely used in the automotive domain, the corresponding controller ubiquitously appears in all these devices. This paper presents a generic and systematic methodology to develop an effective in-field test procedure for CAN controllers based on a functional approach (i.e., on the adoption of self-test libraries). The method can be customized to match the requirements coming from different scenarios, and allows the test engineer to maximize the achieved fault coverage in terms of structural faults in the different cases. The experimental results we gathered on a representative CAN controller model show that, given two typical testing scenarios, we are able to detect 84.28% and 87.62% of stuck-at faults, respectively, hence demonstrating the effectiveness of the proposed approach.

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