2014 IEEE 23rd Asian Test Symposium 2014
DOI: 10.1109/ats.2014.48
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An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution

Abstract: In this paper we will describe a solution to test I/O cells that use four level pulse amplitude modulation (PAM-4) at data rates of 32 Gbaud using a commercial ATE platform without any external instruments. The solution is based on an active test fixture where a retimed digital to analog converter (DAC) is used to generate the PAM-4 stimulus signaling. The comparator side is implemented using a single differential comparator and three consecutive functional tests with different patterns and compare threshold v… Show more

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Cited by 2 publications
(2 citation statements)
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“…In addition, they provided an overview of test pattern creation, acquisition, and control implementations. The work in [48] explained how to test and classify HSIO interfaces using external measuring devices and ATE. The problems that the tester faced when working through high-speed devices were also mentioned.…”
Section: Testing and Debugging Of High-speed Interfacesmentioning
confidence: 99%
See 1 more Smart Citation
“…In addition, they provided an overview of test pattern creation, acquisition, and control implementations. The work in [48] explained how to test and classify HSIO interfaces using external measuring devices and ATE. The problems that the tester faced when working through high-speed devices were also mentioned.…”
Section: Testing and Debugging Of High-speed Interfacesmentioning
confidence: 99%
“…Focus on manufacturing testing. Moreira and Werkmann (2016) [48] Use of automated test equipment (ATE) and external measuring devices to characterize and test high-speed I/O digital interfaces.…”
Section: Testing and Debugging Of High-speed Interfacesmentioning
confidence: 99%