2020
DOI: 10.2172/1630308
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An approach for the measurement of the bulk temperature of single crystal diamond using an X-ray Free Electron Laser

Abstract: We present a method to determine the bulk temperature of a single crystal diamond sample at an X-Ray free electron laser using inelastic X-ray scattering. The experiment was performed at the high energy density instrument at the European XFEL GmbH, Germany. The technique, based on inelastic X-ray scattering and the principle of detailed balance, was demonstrated to give accurate temperature measurements, within 8% for both room temperature diamond and heated diamond to 500 K. Here, the temperature was increase… Show more

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Cited by 10 publications
(19 citation statements)
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References 28 publications
(36 reference statements)
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“…As shown in Fig. 18, this is sufficient to resolve inelastic X-ray scattering from phonons in solids, or ion-acoustic waves in plasmas (Wollenweber et al, 2021;Descamps et al, 2020).…”
Section: Interaction Chambermentioning
confidence: 99%
“…As shown in Fig. 18, this is sufficient to resolve inelastic X-ray scattering from phonons in solids, or ion-acoustic waves in plasmas (Wollenweber et al, 2021;Descamps et al, 2020).…”
Section: Interaction Chambermentioning
confidence: 99%
“…Oxford has pushed hard for UK involvement in the European XFEL in Hamburg, Germany [26] . Gianluca Gregori led the first user commissioning experiment on the MEC (Matter in Extreme Conditions) end station in May 2019 [27] . The experimental team are shown in Figure 4 in the MEC end station.…”
Section: University Of Oxfordmentioning
confidence: 99%
“…Among other facilities of this kind, i.e. MEC at LCLS (Glenzer et al, 2016), BL3-EH5 at SACLA (Inubushi et al, 2020), DCS at APS (Wang et al, 2019) and HED at EuXFEL (Descamps et al, 2020), HPLF-I is the only one dedicated to and optimized for XAS in both the XANES and the EXAFS range. However, XANES of laser-shocked Fe has also been measured at MEC (Harmand et al, 2015), but with limited data quality, mostly due to intrinsic intensity fluctuations of the X-ray beam, leading to the need for averaging over multiple acquisitions.…”
Section: Introductionmentioning
confidence: 99%