The High Energy Density Scientific Instrument at the European XFEL

Zastrau, U.; Appel, Karen; Baehtz, Carsten; Baehr, O.; Batchelor, L E; Berghäuser, A.; Banjafar, Mohammadreza; Brambrink, E.; Cerantola, Valerio; Cowan, T. E.; Damker, H.; Dietrich, Stefano; Cafiso, S. Di Dio; Dreyer, J.; Engel, Herbert; Feldmann, Thorsten; Findeisen, Stefan; Foese, M.; Fulla-Marsa, D.; Göde, S.; Hassan, M. H. A.; Hauser, Jens; Herrmannsdörfer, T.; Höppner, Hauke; Kaa, Johannes; Kaever, P.; Knöfel, K.; Konôpková, Zuzana; García, Alejandro Laso; Liermann, Hanns‐Peter; Mainberger, J.; Makita, Mikako; Martens, E.-C.; McBride, E. E.; Möller, D.; Nakatsutsumi, M.; Pełka, A.; Plueckthun, C.; Prescher, Clemens; Preston, Thomas R.; Roper, Mark; Schmidt, Albrecht; Seidel, W.; Schwinkendorf, Jan-Patrick; Schoelmerich, Markus; Schramm, U.; Schropp, Andreas; Strohm, C.; Sukharnikov, K.; Talkovski, P.; Thorpe, Ian; Toncian, M.; Toncian, T.; Wollenweber, L.; Yamamoto, Shingo; Tschentscher, Thomas

doi:10.1107/s1600577521007335

Cited by 46 publications

(28 citation statements)

References 96 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The X-ray beam transport from the undulator up to the HED experimental hutch is schematically shown in Fig. 1 [a detailed description of the X-ray transport optics is given by Zastrau et al (2021)]. The X-ray focusing system of the HED instrument is based entirely on the use of a beryllium compound refractive lens (CRL) with parabolic surfaces of individual refractive lenses.…”

Section: Experimental Methodsmentioning

confidence: 99%

“…Four CRL lens units (1-4) can be used to focus the beam at different positions along the HED beamline (Zastrau et al, 2021;Schneidmiller & Yurkov, 2011). In our experiment, the SASE2 undulator was tuned to deliver short X-ray pulses of $ 40 fs duration and peak pulse energy of $ 2 mJ at a photon energy of 9 keV.…”

Section: Experimental Methodsmentioning

confidence: 99%

“…Beryllium compound refractive lenses used in the experiment on diagnostics of the X-ray focusing at the HED instrument (Zastrau et al, 2021).…”

Section: Tablementioning

confidence: 99%

See 2 more Smart Citations

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Makarov¹,

Makita²,

Nakatsutsumi³

et al. 2023

J Synchrotron Radiat

Self Cite

View full text Add to dashboard Cite

The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating.

show abstract

Section: Experimental Methodsmentioning

confidence: 99%

Section: Experimental Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Makarov¹,

Makita²,

Nakatsutsumi³

et al. 2023

J Synchrotron Radiat

Self Cite

View full text Add to dashboard Cite

show abstract

“…While in work, the perturbing vector potential was chosen in the linear regime, our method is also valid in the non-linear regime. This will enable studying the response of materials under extreme conditions accessible through recent advances in free-electron lasers [87,88].…”

mentioning

confidence: 99%

Electrical Conductivity of Iron in Earth's Core from Microscopic Ohm's Law

Ramakrishna¹,

Lokamani²,

Baczewski³

et al. 2022

Preprint

View full text Add to dashboard Cite

Understanding the electronic transport properties of iron under high temperatures and pressures is essential for constraining geophysical processes. The difficulty of reliably measuring these properties under Earth-core conditions calls for sophisticated theoretical methods that can support diagnostics. We present results of the electrical conductivity within the pressure and temperature ranges found in Earth's core from simulating microscopic Ohm's law using time-dependent density functional theory. Our predictions provide a new perspective on resolving discrepancies in recent experiments.

show abstract

“…

…”

mentioning

confidence: 99%

Per-pixel XFEL diffraction data processing for wavelength deconvolution

Young¹,

Mendez²,

Bolotovsky³

et al. 2022

Acta Cryst Sect A

View full text Add to dashboard Cite

Advances in XFEL and detector technologies are on track to be able to enable diffraction experiments in the kHz and even MHz regimes at several linear accelerators worldwide in the coming years (Zastrau et al. 2021;Zhang et al. 2020). The computational demands of such experiments are daunting from many angles, but their scientific potential is equally incredible (Blaschke et al. 2021). One type of experiment piloted at current LCLS pulse repetition rates aims to pinpoint oxidation states of individual metal ions in a crystal structure without scanning the metal edge -or, more accurately, by collecting diffraction data from all wavelengths simultaneously and deconvoluting their contributions after the fact (Sauter et al. 2020). The natural bandwidth of LCLS pulses is already optimal for spanning the metal edge, and the stochastic individual spectra can be recorded in order to track their contributions at each wavelength. The diffraction signal attributable to each wavelength accumulates at a slightly different position on the detector for each Bragg peak, since each wavelength produces slightly different diffracting conditions, producing radially streaked reflections. The distribution of signal depends on several factors: the spectrum of the X-ray pulse irradiating the crystal, the precise crystal parameters and orientation, the wavelengthdependent parallax effect and the point-spread function on the detector. Selecting the values for each of these parameters that best fit the pixel-wise image data allows us to track and individually recover the contributions of each wavelength to each Bragg peak. This process has been validated on simulated data with the program nanoBragg (Mendez et al. 2020). To extend it to experimental data, we require the ability to refine individual pixel observations against the crystal model in a computationally feasible manner. The development of diffBragg addresses this step by computing first derivatives of complete (pixel-wise) images to use in global minimization. Finally, incorporation of this approach into the existing xfel.stills_process pipeline and the codevelopment of these tools with the exascale computing framework necessary to use them at scale are expected to make this approach tractable at upcoming XFEL experiments.

show abstract

The High Energy Density Scientific Instrument at the European XFEL

Cited by 46 publications

References 96 publications

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Electrical Conductivity of Iron in Earth's Core from Microscopic Ohm's Law

Per-pixel XFEL diffraction data processing for wavelength deconvolution

Contact Info

Product

Resources

About