An analysis of the field failure of passive and active components

Campbell, D. S.; Hayes, J. A.

doi:10.1002/qre.4680060305

Cited by 4 publications

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“…The organization and some preliminary results have been discussed in several papers. [1][2][3] The detailed nature of the data collected has meant that as more data becomes available for each component type, it is possible to investigate the time dependent reliability behaviour of a range of electronic components based on field failure information. This method of presenting component behaviour examines the traditional constant failure rate assumption for electronic components as used in existing models for reliability p r e d i~t i o n .~-~…”

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Reliability behaviour of electronic components as a function of time

Campbell

Hayes

Jones

et al. 1992

Quality & Reliability Eng

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Considerable attention has been paid recently to the behaviour of the hazard rate function h(t) as a function of time. This discussion has led to a lot of speculation as to the shape of the traditional 'bathtub' curve showing failure or hazard rate as a function of time. Studies at the International Electronics Reliability Institute (IERI) at Loughborough University of Technology, in the United Kingdom, have recently been examining in detail the database created from field failure returns on a wide spectrum of electronic components. These components are in equipment subject to a spread of environmental conditions. The database created has been exercised with particular reference to the behaviour of MOS ICS, rectangular connectors, bipolar transistors and pn-junction diodes. Data has been analysed using pooled information from a wide variety of sources and also from two specific environmental conditions, ground benign and ground mobile.The results of this analysis are presented and the failure intensities as a function of time are given at 1000 hour intervals up to a total time of 21,000 hours. Confidence limits at the 95 per cent X2 level are also given. The results show a rapidly falling failure intensity for the first few thousand hours and after this time the failure intensity appears to be relatively constant given the accuracy obtainable with the data available. KEY WORDS Electronic components Reliability Time dependent behaviour BACKGROUNDThe collection of electronic component reliability data from the field has been under way at IERI for a period of four years or so. Data has been collected

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