An Accurate FET Modelling from Measured S-Parameters

Kondoh, Hiroshi

doi:10.1109/mwsym.1986.1132197

Cited by 58 publications

(28 citation statements)

References 2 publications

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“…pression 11 . And the sensitivity coefficients of x in 8 terms of the intrinsic elements individually at a certain condition are determined by Figure 2 a .…”

Section: New Systematic Optimization Strategy For Small-signal Mmentioning

confidence: 99%

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A new systematic optimization strategy for microwave power device modeling

You-bao

2000

Microw. Opt. Technol. Lett.

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A new systematic optimization strategy for extracting the model parameters of a small‐signal equivalent circuit for a microwave power GaAs MESFET is proposed. On the basis of sensitivity analysis of error functions to the model elements, rearrangement of the optimization sequence of suberror functions referring to the model element sensitivities, and transformation of the optimization directions of the error functions along with optimal directions, the global‐error function is fast convergent under given starting values. In addition, a logarithmic damping algorithm is also proposed for stabilizing the final results by controlling the updates of insensitive model elements. The results show that the agreement is good between the calculated values and the measurement data of a MESFET. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 269–273, 2000.

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“…pression 11 . And the sensitivity coefficients of x in 8 terms of the intrinsic elements individually at a certain condition are determined by Figure 2 a .…”

Section: New Systematic Optimization Strategy For Small-signal Mmentioning

confidence: 99%

“…As described Ž . above, the sensitivities of the main error function x to 8 the intrinsic elements are all known, so we can regularize Ž . Ž .…”

Section: Figurementioning

confidence: 99%

A new systematic optimization strategy for microwave power device modeling

You-bao

2000

Microw. Opt. Technol. Lett.

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“…Both achieve good results. Van Niekerk and Meyer [5] recently demonstrated a very robust and powerful parameter-extractor based on the method proposed by Kondoh [6]. Kondoh showed that good results can be achieved by breaking the optimization problem into eight subfunctions and optimizing the different model elements only with respect to specific subfunctions.…”

Section: Introductionmentioning

confidence: 99%

“…Van Niekerk and Meyer extended this method by using the maximum number of subproblems, and optimizing them in a sequence in which the order is calculated with a principle components sensitivity analysis. The decomposition process used in the new procedure is, therefore, adaptive, and not based on experimentation, such as in [6].…”

Section: Introductionmentioning

confidence: 99%

“…In particular, the effects of starting values and the final distribution of results have been largely neglected. In this paper, the results of such tests are presented for the algorithm proposed in [5], and for the original algorithm proposed by Kondoh [6]. Robustness tests are performed using a large number of randomly chosen element starting values for each extraction.…”

Section: Introductionmentioning

confidence: 99%

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Performance and limitations of decomposition-based parameter extraction procedures for FET small-signal models

Niekerk

Meyer

1998

IEEE Trans. Microwave Theory Techn.

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A recently proposed optimizer-based parameterextraction technique using adaptive decomposition is subjected to a systematic and rigorous evaluation. The technique is shown to be robust and accurate under varying starting conditions. A study of convergence performance based on decomposition theory and test results is presented. Robustness tests are used to show that commonly used statistical descriptions such as mean and standard deviation are inadequate for presenting these types of test data.

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A new approach for the extraction of an FET equivalent circuit from measured S parameters

Niekerk

Meyer

1996

Microw. Opt. Technol. Lett.

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Figure 4 Characteristic impedance and dispersion characteristicsfor the dominant and first two higher-order modes of shielded dielectric-loaded edge-coupled CBCPW structure with a = 4 mm, h , = h , = 1 mm, E ,~ = 2.22, and other parameters as in Figure 3 choosing appropriate loading and structural parameters, one can optimize the behavior with respect to isolation, singlemode bandwidth, and uniformity of coupling. ABSTRACT A new method for the entraction of the 13-element GaAs FET model from hot S parameters is presented. The method reduces the uniqueness problem that mists between the parasitic gate resistance R, and the channel resistance K,. Ihirteen error functions are used, with the order of o~~rimiza~ion determined through a principle-components semihi& analysis. 0 ABSTRACT In this work we present a new optical& controlled microwave matching technique. In this technique the gap between two microwave coupled

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An Accurate FET Modelling from Measured S-Parameters

Cited by 58 publications

References 2 publications

A new systematic optimization strategy for microwave power device modeling

A new systematic optimization strategy for microwave power device modeling

Performance and limitations of decomposition-based parameter extraction procedures for FET small-signal models

A new approach for the extraction of an FET equivalent circuit from measured S parameters

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