2015
DOI: 10.1016/j.mssp.2015.02.048
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AlxGa1−xN/GaN/AlN heterostructures grown on Si(111) substrates by MBE for MSM UV photodetector applications

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Cited by 21 publications
(2 citation statements)
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“…The results show that by increasing the annealing temperature as well as the light intensities, the device shows better performance. In order to evaluate the current gain and sensitivity, the following equations were used [42][43];…”
Section: Current-time (I-t) Calculations At 10 Vmentioning
confidence: 99%
“…The results show that by increasing the annealing temperature as well as the light intensities, the device shows better performance. In order to evaluate the current gain and sensitivity, the following equations were used [42][43];…”
Section: Current-time (I-t) Calculations At 10 Vmentioning
confidence: 99%
“…Deep ultraviolet (DUV, 190–350 nm) photodetectors have attracted much interest because of their broad application potential in solar UV monitoring, flame detection, secure space communication, and biological analysis. 1–3 Wide-bandgap semiconductors including Mg x Zn 1 −x O, 4 Al x Ga 1 −x N, 5 diamond, 6 and Ga 2 O 3 7,8 are desirable candidates for the fabrication of DUV photodetectors. In particular, Ga 2 O 3 is considered one of the most promising materials for DUV photodetector applications because of its ultra-wide bandgap (4.9 eV) without doping or alloying processes and relatively low cost.…”
Section: Introductionmentioning
confidence: 99%