2017
DOI: 10.1016/j.nimb.2017.06.025
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Aluminosilicate glasses structure under electron irradiation: An EPR study

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Cited by 14 publications
(7 citation statements)
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“…A second process is associated with changes in the local environments (creation of non-bridging O and of 3coordinated O, creation of 5-coordinated Al, conversions between charge compensators and network modifiers) which act as brakes on the swelling. Depending on the relative dominance of these two processes, the glass may swell or contract.Recently, damage caused by irradiation with 2.5MeV electrons was studied for a series of glasses composed of SiO2, Al2O3, Na2O, and CaO in varying quantities [11]. Different types of electronic defects were brought to light using EPR (defects like OHC, Al, E' centres), with maximum concentrations for an irradiation dose of 1GGy.…”
mentioning
confidence: 99%
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“…A second process is associated with changes in the local environments (creation of non-bridging O and of 3coordinated O, creation of 5-coordinated Al, conversions between charge compensators and network modifiers) which act as brakes on the swelling. Depending on the relative dominance of these two processes, the glass may swell or contract.Recently, damage caused by irradiation with 2.5MeV electrons was studied for a series of glasses composed of SiO2, Al2O3, Na2O, and CaO in varying quantities [11]. Different types of electronic defects were brought to light using EPR (defects like OHC, Al, E' centres), with maximum concentrations for an irradiation dose of 1GGy.…”
mentioning
confidence: 99%
“…Recently, damage caused by irradiation with 2.5MeV electrons was studied for a series of glasses composed of SiO2, Al2O3, Na2O, and CaO in varying quantities [11]. Different types of electronic defects were brought to light using EPR (defects like OHC, Al, E' centres), with maximum concentrations for an irradiation dose of 1GGy.…”
mentioning
confidence: 99%
“…The observed results from the figure suggest that the order of decrease in the EPR signal relative to the TL signal. The subsequent comparison will be used to calculate the thermal activation energy of the SOHC center within the network, which is the leading cause for these radicals in the TL mechanism [39,40]. In this process, the Si 4+ ions are replaced with two Cr 3+ ions, which leads to weaker Si-O linkages within the network.…”
Section: Correlation -Electron Paramagnetic Resonance and Thermoluminiscencementioning
confidence: 99%
“…Boizot found that quartz containing Zr 2 O 3 Zr 3+ defects was formed by irradiation [ 9 ]. MoO 2 in glass-ceramics formed Mo 5+ defects [ 10 ]. Ollier et al [ 11 ] studied TiO 2 -containing borate glass exposed to different layers.…”
Section: Introductionmentioning
confidence: 99%