Alternative test methods using IEEE 1149.4

Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test

“…As Kac et al have demonstrated, designers can reconfigure select analog functional blocks into a selftesting structure by establishing connections via the Dot 4 analog test bus, and thus perform efficient go/nogo functional tests. 13 Consider, for example, a device with an active resistor-capacitor (RC) filter core, as depicted in Figure 5 (next page). The core input and output are connected to ABMs.…”