2015
DOI: 10.1002/pssa.201431747
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AlN, ZnO thin films and AlN/ZnO or ZnO/AlN multilayer structures deposited by PLD for surface acoustic wave applications

Abstract: Phone: þ33 587 502 331 (0002)-oriented AlN and ZnO thin films are deposited on C-sapphire substrates by pulsed laser deposition at 700 8C. Multilayered structures AlN/ZnO and ZnO/AlN are also grown on C-sapphire and investigated by X-ray diffraction, scanning electron microscopy and transmission measurements. Ellipsometry analysis is employed to investigate the stack of layers and the optical properties of thin films. This non-destructive analysis identified an intermediate layer between AlN and ZnO thin films… Show more

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Cited by 14 publications
(7 citation statements)
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“…The acoustoelectric effect in the case of a single sensitive layer leads to a relative change of wave propagation velocity Δν given by where Δf is the frequency shift, f 0 the central frequency of the SAW device, ν 0 the unperturbed SAW velocity, K the electromechanical coefficient, C s = ε 0 + ε p is the sum of the permittivity of the region above the film and the substrate, and σ s is the surface conductivity of the sensing film [ 11 , 18 ]. In the case of bilayers, important additional parameters which determine velocity changes are the electrical conductivities of both layers and their thicknesses, since both film layers influence the SAW propagation through interaction between their mobile charges and the travelling electron potential φ of the SAW [ 17 ].…”
Section: Discussionmentioning
confidence: 99%
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“…The acoustoelectric effect in the case of a single sensitive layer leads to a relative change of wave propagation velocity Δν given by where Δf is the frequency shift, f 0 the central frequency of the SAW device, ν 0 the unperturbed SAW velocity, K the electromechanical coefficient, C s = ε 0 + ε p is the sum of the permittivity of the region above the film and the substrate, and σ s is the surface conductivity of the sensing film [ 11 , 18 ]. In the case of bilayers, important additional parameters which determine velocity changes are the electrical conductivities of both layers and their thicknesses, since both film layers influence the SAW propagation through interaction between their mobile charges and the travelling electron potential φ of the SAW [ 17 ].…”
Section: Discussionmentioning
confidence: 99%
“…The sensitive layers of the SAW sensors were deposited onto ST-X quartz substrates by pulsed laser deposition (PLD). PLD was used because it presents a series of advantages in thin film deposition in general [ 17 , 26 ], and in particular has been proven to allow good control of sensitive film porosity, which is essential for SAW gas sensors [ 20 ]. The beam of a Nd:YVO 4 laser is focused onto the surface of the target, leading to ablation of the target material and deposition onto a substrate placed at a distance of 35 mm in front of the target and parallel to its surface ( Figure 1 ).…”
Section: Methodsmentioning
confidence: 99%
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“…The velocities of Rayleigh wave and Sezawa modes were calculated to be 2566.1 m s À1 and 5111.2 m s À1 for l of 12 mm and to be 2679 m s À1 and 5305 m s À1 for l of 20 mm, respectively. The Rayleigh phase velocity of the pure ZnO is $2500 m s À1 , 18 whereas that for the Rayleigh wave in glass is 3200 m s À1 , 19 which is larger than that of ZnO lm. When the wavelength is decreased, more energy is conned within the ZnO lm, thus resulting in a lower velocity of wave propagation, and leading to a lower velocity of the layered structure.…”
Section: Resultsmentioning
confidence: 83%
“…This perturbation can occur through mechanical or electrical effects, mainly through changes in mass density or electrical conductivity (Devkota et al, 2017). Various materials have been used for the sensitive layers of SAW sensors, such as ZnO, AlN, WO 3 , Pd or SnO 2 (Mujahid and Dickert, 2017;Dutheil et al, 2015). In sensing, one of the most important issues is the minimum amount of analyte that can still be distinguished, the so-called limit of detection (LOD).…”
Section: Introductionmentioning
confidence: 99%