All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits

Park, Gyusung; Kim, Minsu; Kim, Chris H.; Kim, Bongjin; Reddy, V.

doi:10.1109/irps.2018.8353613

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Cited by 2 publications

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On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments

Park

Kim

Bae

et al. 2018

Sci Rep

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Microwave-induced thermal curing is demonstrated to improve the reliability and to prolong the lifetime of chips containing nanoscale electron devices. A film containing graphite powder with high microwave absorbing efficiency was fabricated at low cost. The film is flexible, bendable, foldable, and attachable to a chip. A commercial off-the-shelf chip and a representative 3-dimensional (3D) metal-oxide-semiconductor field-effect transistor (MOSFET), known as FinFET, were utilized to verify the curing behaviors of the microwave-induced heat treatment. The heat effectively cured not only total ionizing dose (TID) damage from the external environment, but also internal electrical stress such as hot-carrier injection (HCI), which are representative sources of damages in MOSFET insulators. Then, the characteristics of the pre- and post-curing electron devices are investigated using electrical measurements and numerical simulations.

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On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments

Park

Kim

Bae

et al. 2018

Sci Rep

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show abstract

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Park

Kim

et al. 2021

2021 IEEE International Reliability Physics Symposium (IRPS)

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All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits

Abstract: All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits

Cited by 2 publications

References 13 publications

On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments

On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

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