Alignment Tolerance Control of the Micro CPV Array Using Monte Carlo Methods

Araki, Kiyomichi; Lee, Kan‐Hua; Hayashi, Nobuhiko; Ichihashi, Kouki; Kanayama, Shutetsu; Inohara, Takuji; Morita, Yohei; Takase, M.; Yamaguchi, Masafumi

doi:10.1109/pvsc40753.2019.8980753

Cited by 2 publications

(2 citation statements)

References 52 publications

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“…A total of 1000 iterations is sufficient to determine the means and the variations of the output variable, but it is not sufficient to determine the rejection percentage, where at least 10000 iterations Monte Carlo method is used in many other applications. It is used to determine the ation yields of complex fiber designs for lasers considering the fabrication tolerances [7], simulate assembly error in concentrator photovoltaic (CPV) array [8], and analysis of the effects that random manufacturing errors produce on the radiation diagram of resonant slotted waveguide linear antennas [9]. Monte Carlo simulations have been widely used in the reliability assessment of power electronics systems [10].…”

Section: Fig 5 Assembly Tolerance Analysis By Monte Carlo Simulationmentioning

confidence: 99%

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Talledo¹,

Cabading²,

Real³

2021

JERR

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This study focuses on eliminating the lead pullback problem in an automotive quad flat no lead (QFN) package in order to meet the non-negotiable requirement to have a solder wettable or solderable lead sidewall. It involves using a non-traditional approach of Monte Carlo tolerance analysis to determine the final leadframe and singulation blade design solution. It was found out that the zero lead pullback could be achieved by reducing the leadframe lead to lead distance from 0.275 mm to 0.225 mm and increasing the blade thickness from 0.325 mm to 0.350 mm. Actual results from 10 line stressing lots all showed zero pullback validating the effectiveness of the final design and the use of Monte Carlo tolerance analysis technique. Costly investment for a lead pullback inspection system was avoided and the 100% manual inspection eliminated.

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Section: Fig 5 Assembly Tolerance Analysis By Monte Carlo Simulationmentioning

confidence: 99%

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Talledo¹,

Cabading²,

Real³

2021

JERR

View full text Add to dashboard Cite

show abstract

“…Many factors, such as the misalignment of assembling or tracking errors, give rises to these inconsistencies. To further resolve and quantify these sources of errors within the PIC modules, we modified a Monte Carlo analysis proposed in Araki et al 15 to predict the module efficiencies against the error of certain module parameters. This Monte Carlo analysis is outlined as the follows.…”

Section: Modeling the Manufacturing Errorsmentioning

confidence: 99%

Demonstration and error analysis of scaling‐up plastic‐integrated concentrator photovoltaic panels to 1 m²

Lee

Hayashi

Takase

2020

Progress in Photovoltaics

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Plastic lens integrated III‐V compound semiconductor cell (PIC) modules or other microconcentrator/miniconcentrator photovoltaic (CPV) modules reduce the volume and weight of CPV modules to a size comparable to flat panel photovoltaics. However, the areal density of solar cells and lenses in a PIC or other micro‐mini‐CPV modules significantly increases by at least an order of magnitude, which raises the required precision and consistency of the module assembling, because a slightly misaligned solar cell can limit the current of the whole circuit and inhibit the performance of the full module. In this study, we presented the results of a 1 m2 module consisting of 2025 solar cells with a direct‐normal‐irradiance efficiency of more than 30%. To the best of our knowledge, this is the largest area for a CPV module with a height of less than 5 cm reported so far. To quantify the different causes of misalignment, we proposed a probabilistic analysis to model how these errors affect the performance of the CPV module. The results show that the dominant error of the PIC module is attributed to around 0.5° misaligned orientation between the unit modules. This analysis approach can also be applied to other types of micro‐CPV modules.

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Alignment Tolerance Control of the Micro CPV Array Using Monte Carlo Methods

Cited by 2 publications

References 52 publications

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Demonstration and error analysis of scaling‐up plastic‐integrated concentrator photovoltaic panels to 1 m²

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Alignment Tolerance Control of the Micro CPV Array Using Monte Carlo Methods

Cited by 2 publications

References 52 publications

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Automotive Package Lead Pullback Elimination Using Monte Carlo Analysis for Determining Leadframe and Blade Design

Demonstration and error analysis of scaling‐up plastic‐integrated concentrator photovoltaic panels to 1 m2

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Demonstration and error analysis of scaling‐up plastic‐integrated concentrator photovoltaic panels to 1 m²