“…15, we consider the case when the current in the OCL is to a significant extent controlled by diffusion and, correspondingly, the carrier density distribution is not flat across the OCL. In our previous work, 18 this carrier distribution was evaluated for the case when the recombination in the OCL can be neglected, and it was shown that the part of the carrier density proportional to the current in the part of the OCL adjacent to the n contact ͑0 Ͻ x Ͻ l a ͒ is usually negligible compared to its counterpart in the other side of the OCL, adjacent to the p contact ͑l a Ͻ x Ͻ h͒, due to the electron mobility being much higher than that of holes. The recombination does not change this relationship of mobilities and hence of carrier densities; therefore, below, we shall concentrate our analysis on the "p side" of the OCL ͑between the active layer and the p cladding, l a Ͻ x Ͻ h͒, assuming that the total carrier recombination in the n side, and thus its contribution to the internal efficiency reduction, is negligible.…”