pinholes with an average diameter of ≈135 nm. These pinholes form channels that wiggle within the spiro-MeOTAD fi lm, and are thought to accelerate diffusion of gas molecules from ambient air (e.g., H 2 O and O 2 ) into the perovskite layer in perovskite-based solar cells. [ 8c ] They also facilitate the outward diffusion of chemical elements/compounds, such as LiTFSI, which is hygroscopic. Therefore, ambient air exposure results in a re-distribution of LiTFSI dopants across the spiro-MeOTAD fi lm. [ 8c ] Efforts have been made to better understand environmental effects on LiTFSI-doped spiro-MeOTAD fi lms. [ 8c , 11b , 12,14 ] However, a clear understanding of the LiTFSI dopant re-distribution process and resulted effects is still lacking. It is crucial to study LiTFSI-doped spiro-MeOTAD charge dynamics under controlled environmental conditions to understand the overall current-voltage behavior of perovskite solar cells. [ 15 ] We investigated the effects of environmental H 2 O vapor with a relative humidity (RH%) of 90% at room temperature (RT) of 25 ºC that is generated by letting a stream of dry N 2 gas fl ow through an H 2 O bubbler, high purity dry O 2 gas (>99.5%), and ambient air (RH 50%, RT 25 ºC) on electrical properties of hole-only devices of LiTFSI-doped spiro-MeOTAD fi lms, using mercury drop electrode I -V measurements. We also examined chemical and electronic properties using X-ray photoelectron spectroscopy (XPS) and ultraviolet photoemission spectroscopy (UPS), respectively.XPS measurments were performed to determine the main component in ambient air that drives the re-distribution of LiTFSI dopants across spiro-MeOTAD fi lms upon ambient air exposure ( Figure S1, Supporting Information). LiTFSI-doped spiro-MeOTAD fi lms were exposed to controlled environments of H 2 O vapor (RH 90%, RT 25 ºC) and dry O 2 gas. Afterward, the chemical states of gas-exposed fi lms were studied using XPS. In F-1s and S-2p regions ( Figure 1 a,b,d,e), as-prepared fi lms showed small peaks at ≈688.7 eV and ≈169.4 eV in the binding energy (BE) scale, respectively, and were assigned to the TFSI molecule ( Figure S1, Supporting Information). [ 16 ] Gradual increases in both F-1s and S-2p peaks were observed when samples were exposed to H 2 O vapor. By contrast, changes in XPS peak intensities for F-1s and S-2p were not observed when samples were exposed to O 2 . This observation reveals that re-distribution of LiTFSI within the doped spiro-MeOTAD fi lm to reach the top surface is mainly driven by H 2 O vapor exposure.Unlike ambient air exposure, [ 8c ] with H 2