2002
DOI: 10.1016/s0142-9612(01)00292-7
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AFM and SFG studies of pHEMA-based hydrogel contact lens surfaces in saline solution: adhesion, friction, and the presence of non-crosslinked polymer chains at the surface

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Cited by 141 publications
(127 citation statements)
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“…Observations were made using both Scanning Electron Microscopy (SEM) and AFM, indicating that cast-molded lenses show lower root-meansquare (RMS) roughness values, in agreement with the results of Rabke et al [1] and Grobe et al [2]. Kim et al [4,5] investigated the surface of hydrogel pHEMA-based CLs by using AFM and measuring the friction and adhesive forces. They found that in saline solution these magnitudes were significantly reduced, compared to those measured for the surface-dehydrated state.…”
Section: Introductionsupporting
confidence: 79%
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“…Observations were made using both Scanning Electron Microscopy (SEM) and AFM, indicating that cast-molded lenses show lower root-meansquare (RMS) roughness values, in agreement with the results of Rabke et al [1] and Grobe et al [2]. Kim et al [4,5] investigated the surface of hydrogel pHEMA-based CLs by using AFM and measuring the friction and adhesive forces. They found that in saline solution these magnitudes were significantly reduced, compared to those measured for the surface-dehydrated state.…”
Section: Introductionsupporting
confidence: 79%
“…These studies clearly show that the fabrication technique has a notable influence on the lens roughness, being the cast-molded lenses those showing lower Rq values. Kim et al [4,5] also reported values of Rq in pHEMA-based hydrogel lenses ranging from 8 to 23 nm.…”
Section: Topographic Analysismentioning
confidence: 98%
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“…The method has the advantages that it avoids artefacts due to dehydration and coating (Bhatia et al, 1997;Kim et al, 2002), and allows for non-destructive surface topography and roughness measurements. AFM consists of a microscale cantilever with a sharp tip (probe) that is used to scan the specimen surface.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
“…AFM is a very powerful tool for high resolution examination of hydrated CL surface structure. The method avoids artifacts due to dehydration and coating (Bhatia et al, 1997;Kim et al, 2002). However, when using AFM to analyse CL surface the area of measurement is very small, so it may be answered how representative of the total lens are Ra and Rms obtained by AFM.…”
Section: Atomic Force Microscopymentioning
confidence: 99%