“…Although EDS is frequently coupled to TEM or SEM in any analytical scenario, other techniques like electron diffraction and electron energy-loss spectroscopy have also been considered to obtain structural information. The use of transmission electron microscopes working in scanning mode (STEM), 83,90,100,126,148,193,259,260,262 with high-angle annular dark-field detection, 46,134,218 allows to obtain Z-contrast images that can also add information about the chemical composition of the nanoparticles. Even though XAS techniques do not provide information on nanoparticle morphology, they have also been considered in some works 166,182,185,187,226 because of the interest for improving the information about the composition of the nanoparticles in complex samples.…”