The energy resolved computed tomography (CT), which had advantage over conventional CT (twofold higher CT value for iodine contrast agent and being free from beam hardening effect), was shown practical by employing the transXend detector: it measured X-rays as electric current and gave energy distribution of incident X-rays after analysis. This article shows a new application of the transXend detector for estimating the thicknesses of acrylic, iodine, and aluminum in a phantom. For this purpose, the responses of the segment detectors in the transXend detector are changed intentionally with inserting filters. With previously obtained two-dimensional maps for acrylic-iodine and acrylicaluminum thicknesses, which are shown by the ratios of electric currents measured by the segment detectors, the thickness of materials on the path of the X-rays are obtained by a transmission measurement.