2000
DOI: 10.1142/9789812793614_0003
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Advances in Measurements of Physical Parameters of Semiconductor Lasers

Abstract: We present a summary of advances in characterization techniques allowing for comprehensive study of physical processes in semiconductor lasers. 5. Electrical and optical measurements of RF modulation response below threshold. 5.1. Determination of the differential carrier lifetime from the device impedance. 5.2. Determination of the differential carrier lifetime from the optical response measurements. 6. Optical measurements of RF modulation response and RIN above threshold 6.1. Determination of the resonant f… Show more

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Cited by 5 publications
(5 citation statements)
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“…7 we plot the estimated threshold current dispersion, which agrees well with the experiment. In general, the linewidth enhancement factor α H varies strongly with the wavelength and carrier density [21]. We also observe such strong variation of α H in our GaAs gain chip.…”
Section: B Microscopic Parameter Extractionsupporting
confidence: 51%
See 1 more Smart Citation
“…7 we plot the estimated threshold current dispersion, which agrees well with the experiment. In general, the linewidth enhancement factor α H varies strongly with the wavelength and carrier density [21]. We also observe such strong variation of α H in our GaAs gain chip.…”
Section: B Microscopic Parameter Extractionsupporting
confidence: 51%
“…In addition to the behavior of the net modal gain coefficient with the temperature and pump current, we extracted the phase amplitude coupling coefficient α H by taking a difference between the two measurements in Figs. 4 and 5 [21]. Note that a strong phase amplitude coupling in semiconductor laser increases the frequency noise and causes the linewidth enhancement by a factor of 1 + α 2 H .…”
Section: B Microscopic Parameter Extractionmentioning
confidence: 98%
“…To further understand the effect of material improvement on the laser performance, comprehensive gain characteristics, loss mechanism, and injection efficiency have been investigated on the QD lasers epitaxially grown on Si. Inside a Fabry−Perot laser cavity, the below-threshold amplified spontaneous emission (ASE) spectrum can be described by 12…”
mentioning
confidence: 99%
“…15 RIN is a common method for characterisation of the modulation bandwidth of semiconductor lasers. 16 …”
Section: Using Rin Spectra To Measure Absorptionmentioning
confidence: 99%