[1993] Proceedings IEEE Micro Electro Mechanical Systems
DOI: 10.1109/memsys.1993.296962
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Adhesive force of the microstructures measured by the atomic force microscope

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Cited by 7 publications
(5 citation statements)
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“…In this case an intermediate material is introduced between the silicon substrate surface and the polysilicon beam surface. The adhesive strength of solid bridging is high [17] but difficult to estimate and is dependent on the type and amount of residue material.…”
Section: Hydrogen Bridgingmentioning
confidence: 99%
“…In this case an intermediate material is introduced between the silicon substrate surface and the polysilicon beam surface. The adhesive strength of solid bridging is high [17] but difficult to estimate and is dependent on the type and amount of residue material.…”
Section: Hydrogen Bridgingmentioning
confidence: 99%
“…2 [Torii93] reflection can be exactly correlated to the probe movement. Instead of a piezotransformer, the probe in the SFM instrument is fastened to a tiny cantilever beam having a small spring constant.…”
Section: Manufacturing and Metrologymentioning
confidence: 96%
“…These microscopes have a very high resolution of about 0.3 nm and can even follow the manipulations of an individual atom [Torii93). !ill, and a newcomer, the scanning probe microscopy (SPM).…”
Section: Manufacturing and Metrologymentioning
confidence: 99%
“…The study on the interaction of micro/nano objects with various surfaces has attracted growing interest in recent decades [1][2][3][4][5][6]. Developments of micro and sub-micro electronics and the research on the interactions of biological objects with various functionalized surfaces in the biomedical, biochemical and pharmaceutical industry have been a driving force [7,8].…”
Section: Introductionmentioning
confidence: 99%