Second NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2007) 2007
DOI: 10.1109/ahs.2007.22
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Addressing the Metric Challenge: Evolved versus Traditional Fault Tolerant Circuits

Abstract: Abstract

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Cited by 6 publications
(6 citation statements)
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“…Such a metric provides evolution with more information about practical solutions and thus supports evolution of solutions. However, as shown in [44], since the traditional metric is designed with traditional design techniques in mind and the EH metric is designed with evolution in mind, the metrics favour the design technique for which the metric was designed. As such, a comparison is difficult.…”
Section: Measurementsmentioning
confidence: 99%
“…Such a metric provides evolution with more information about practical solutions and thus supports evolution of solutions. However, as shown in [44], since the traditional metric is designed with traditional design techniques in mind and the EH metric is designed with evolution in mind, the metrics favour the design technique for which the metric was designed. As such, a comparison is difficult.…”
Section: Measurementsmentioning
confidence: 99%
“…A fitness function was designed that ensures that a fully functioning circuit always scores higher than a circuit that does not function 100% correctly. This function is shown in equation (5). As shown, as long as the functionality is not 100% (f ham is not 1.0), the R ehw_gate part of the fitness function does not contribute to the fitness value.…”
Section: Larger Gate Reliability Experimentsmentioning
confidence: 99%
“…Further work [5], also looked at the reliability metrics themselves and how they compare and may be applied in the context of traditional and evolved designs. As such, none of this work explicitly searched for redundancy structures and the goal herein is to find ways to either implicitly or explicitly specify a search leading to redundancy structures.…”
Section: Single Fault Experimentsmentioning
confidence: 99%
“…The related literature spans this area from offline evolution of fault-tolerant circuits able to withstand defects in silicon [3] without increasing circuit's size significantly [4] or compensating supply voltage drifts [5] by recurrent re-evolution after a series of deteriorating events as the wide-band temperature changes or radiation beams treatments [6,7].…”
Section: Introductionmentioning
confidence: 99%