Evolving Redundant Structures for Reliable Circuits - Lessons Learned

Djupdal, A.; Haddow, Pauline C.

doi:10.1109/ahs.2007.52

Cited by 11 publications

(13 citation statements)

References 15 publications

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“…First generate redundancy using an R trad single based fitness function. As concluded in [9], an R trad single based fitness function is better suited for generating redundancy than an R trad trans based fitness function. Phase one typically generates very bloated circuits.…”

Section: Fitness Functionmentioning

confidence: 99%

The route to a defect tolerant LUT through artificial evolution

Djupdal¹,

Haddow²

2011

Genet Program Evolvable Mach

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Evolutionary techniques may be applied to search for specific structures or functions, as specified in the fitness function. This paper addresses the challenge of finding an appropriate fitness function when searching for generic rather than specific structures which, when combined wiacteristic of defect tolerance on the circuit. Production defects for integrated circuits are expected to increase considerably. To avoid a corresponding drop in yield, improved defect tolerance solutions are needed. In the case of Field Programmable Gate Arrays (FPGAs), the predesigned gate array provides a bridge between production and the application designers. Thus, introduction of defect tolerant techniques to the FPGA itself could provide a defect free gate array to the application designer, despite production defects. The search for defect tolerance presented herein is directed at finding defect tolerant structures for an important building block of FPGAs: Look-Up Tables (LUTs). Two key approaches are presented: (1) applying evolved generic building blocks to a traditional LUT design and (2) evolving the LUT design directly. The results highlight the fact that evolved generic defect tolerant structures can contribute to highly reliable circuit designs at the expense of area usage. Further, they show that applying such a technique, rather than direct evolution, has benefits with respect to evolvability of larger circuits, again at the expense of area usage.

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Section: Fitness Functionmentioning

confidence: 99%

The route to a defect tolerant LUT through artificial evolution

Djupdal¹,

Haddow²

2011

Genet Program Evolvable Mach

View full text Add to dashboard Cite

show abstract

“…In previous work [10] the problem of evolving 100% functional circuits with redundancy was investigated. Like in this paper, reliability in itself was not the main goal, but rather the creation of redundant structures.…”

Section: Previous Workmentioning

confidence: 99%

“…When using the gate reliability model, no form of [10] redundancy was achieved as the simplest solution for evolution was to minimise the number of gates used in implementing a fully functional circuit. The single fault model experiments on the other hand created larger circuits containing redundant gates.…”

Section: Previous Workmentioning

confidence: 99%

“…The first evolved structure in [10] containing redundant gates had the form shown in figure 1(a). The subcircuit marked f implements the desired function and the subcircuit marked r implements any function.…”

Section: Previous Workmentioning

confidence: 99%

“…This was also tried in [10]. Any subcircuit with unreachable gates as the only outputs can be excluded when R trad_single is calculated.…”

Section: Previous Workmentioning

confidence: 99%

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