2009
DOI: 10.1063/1.3254895
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Addressable photocharging of single quantum dots assisted with atomic force microscopy probe

Abstract: Articles you may be interested inCd1−xMnxTe ultrasmall quantum dots growth in a silicate glass matrix by the fusion method Appl. Phys. Lett. 105, 132410 (2014); 10.1063/1.4897222 Laser irradiation effects on the CdTe/ZnTe quantum dot structure studied by Raman and AFM spectroscopy CdSe self-assembled quantum dots with ZnCdMgSe barriers emitting throughout the visible spectrum Appl. Phys. Lett. 85, 6395 (2004); 10.1063/1.1834993Fluorescence quantum yield of CdSe/ZnS nanocrystals investigated by correlated atomi… Show more

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Cited by 15 publications
(13 citation statements)
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“…One might expect that assembling several quantum dots together, one could get nanoparticles of larger size, and expectedly, higher brightness. However, it is impractical because quantum dots quench their fluorescence when the distance between them is less than ~10 nm 13,39 . Fig.…”
Section: Physical Characteristics Of Ca-dotsmentioning
confidence: 99%
“…One might expect that assembling several quantum dots together, one could get nanoparticles of larger size, and expectedly, higher brightness. However, it is impractical because quantum dots quench their fluorescence when the distance between them is less than ~10 nm 13,39 . Fig.…”
Section: Physical Characteristics Of Ca-dotsmentioning
confidence: 99%
“…For quantitative analysis, the tip-sample system is simply treated as a plane capacitor, and the capacitive electrostatic force gradient would cause a phase shift when applying a bias between the tip and sample. With charges trapped in the nanostructures by laser irradiation, additional phase shift induced by the Coulombic force would be generated [45]. The phase shift detected by EFM can be described as [46][47]…”
Section: Photo-generated Trapped Charges and Barrier Height Modificationmentioning
confidence: 99%
“…For quantitative analysis, the tip-sample system is simply treated as a plane capacitor, and the capacitive electrostatic force gradient would cause a phase shift when applying a bias between the tip and sample. With charges trapped in the nanostructures by laser irradiation, additional phase shift induced by the Coulombic force would be generated [53]. The phase shift detected by EFM can be described as [54][55]…”
Section: Photo-generated Trapped Charges and Barrier Height Modificationmentioning
confidence: 99%