ADC testing with poly-harmonic signals

Vedral, Josef

doi:10.1109/ims3tw.2010.5503120

Cited by 7 publications

(3 citation statements)

References 4 publications

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“…Table 1 shows the complete results of testing. THD, SINAD, SNR values [12] were calculated directly inside MATLAB R2015b. Additional parameter values have been obtained from ( 5) and ( 6) below.…”

Section: Analogue-to-digital Convertermentioning

confidence: 99%

Metrology and Measurement Systems

Teren¹,

Tomlain²,

Sedláček³

2018

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This paper deals with a comparison between digital and analogue implementation of a synchronous detection algorithm. The commonly used implementation methods of synchronous detection are presented in the paper. The paper describes FPGA-based digital and analogue hardware approaches, focusing on the digital design. The characteristics of used analogue-to-digital converters are measured. Both proposed approaches are directly compared in terms of sensitivity and long-term stability. The achieved results, along with identified limitations and proposed improvements are widely discussed.

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Section: Analogue-to-digital Convertermentioning

confidence: 99%

Metrology and Measurement Systems

Teren¹,

Tomlain²,

Sedláček³

2018

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“…There are two general but important presumptions for testing a DAC: [6][7][8][9] -to test near Full Scale(FS) -it is necessary to ensure that the Peak-to-Peak value covers FS of DUT; -the second condition is that the Slew Rate SR of the signal is slower than the SR of the DUT (a generator) and the digitizer as well (5). The SR's maximum of the DSW has the same value as the SR's maximum of the sine-wave so it is possible to use the standard formula for the SR.…”

Section: Testing With a Multi-tone Signalmentioning

confidence: 99%

DAC Testing Using Impulse Signals

Vedral¹,

Fexa²

2012

Metrology and Measurement Systems

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The Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an easier way to generate a MT signal using several impulse signals. The article also analyzes qualities of methods for testing the dynamic parameters of Digital to Analog Converters using an impulse signal. The MT, Damped Sine Wave (DSW) and Sinx/x (SINC) signals will be used as the source for these tests. The Effective Number of Bits (ENOB) and Signal to noise and distortion (SINAD) are evaluated in the frequency domain and they are modified using the Crest Factor (CF) correction and compared with the standard results of the Sine Wave FFT test. The first advantage of the test using an impulse signal is that you need fewer input parameters to create the band signal for testing the DAC. The second one is to reduce the testing time using a band signal in comparison with multiple tests using a single sine wave.

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“…Unfortunately, the spectrum amplitude frequency characteristic of the exponential signal falls with a slope of -20 dB per decade [4,5,6]. This fact causes variation of results reached by classic methods using a signal with constant amplitude and the exponential signal test method.…”

Section: Introductionmentioning

confidence: 99%

DAC Testing Using Modulated Signals

Fexa¹,

Vedral²,

Svatoš³

2011

Metrology and Measurement Systems

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This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Analog Converters (DAC) using a multi-frequency signal. As the source for these signals, Amplitude Modulated (AM) and Frequency Modulated (FM) signals are used. These signals are often used in radio engineering. Results of the tests, like Effective Number of Bits (ENOB), Signal-to-Noise and Distortion (SINAD), are evaluated in the frequency domain and they are compared with standard results of Sine Wave FFT test methods. The aim of this research is firstly to test whether it is possible to test a DAC using modulated signals, secondly to reduce testing time, while estimating band performance of DAC.

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ADC testing with poly-harmonic signals

Cited by 7 publications

References 4 publications

Metrology and Measurement Systems

Metrology and Measurement Systems

DAC Testing Using Impulse Signals

DAC Testing Using Modulated Signals

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