ADC sinewave histogram testing with quasi-coherent sampling

Measuring Static Parameters of Embedded ADC Core

“…Histogram method [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19] is an established approach for determining the static parameters. In histogram testing, ADC code transition levels are determined through statistical analysis of converter activity.…”

“…Earlier references [4][5][6][7] primarily concentrate on how the code density can be interpreted to compute the differential and integral nonlinearities, gain error and offset error, and estimate the achieved accuracy under different measurement conditions. More recently, the accuracy of ADC testing with sine-wave stimulus has been analyzed under the assumption of quasi coherent sampling and a bound on the variance of the transition level estimators have been derived in [8].…”

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method

“…To that effect several types ADC tests can be used. The most common one, for the estimation of an ADC transfer function, is the Histogram Test (also known as Code Density Test) [1][2][3][4][5][6][7][8][9]. This is a statistical test where a sinusoidal stimulus signal is applied and a large amount of samples are required.…”

An automated procedure for selecting frequency and record length when testing data converters

“…However, coherent sampling cannot be easily obtained in practice, due to the limited frequency accuracy of both the converter clock and the stimulus generator. Consequently, in [3] and [4] the problem has been analyzed, describing some effects of the loss of coherency on the validity of the sufficient condition. In particular, it has been shown in [3] that, when sampling is incoherent, the excitation of each converter code may be guaranteed by increasing the record length.…”