Adaptive Optics in Confocal Microscopy

O’Byrne, John W.; Fekete, P. W.; Arnison, Matthew R.; Zhao, Hongran; Serrano, M.; Philp, D.; Sudiarta, W.; Cogswell, Carol J.

doi:10.1142/9789812817815_0014

Cited by 7 publications

(6 citation statements)

References 5 publications

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“…One of the earliest implementations of adaptive optics in microscopy was the use of tip/tilt correction in a transmission confocal microscope (O'Byrne et al 1999). The major problem encountered here is that the position of the spot at the detector is shifted laterally by structures in the specimen.…”

Section: Adaptive Optics For Microscopy (A ) Implementations Of Adaptive Optics In Microscopymentioning

confidence: 99%

Adaptive optics in microscopy

Booth

2007

Phil. Trans. R. Soc. A.

428

266

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The imaging properties of optical microscopes are often compromised by aberrations that reduce image resolution and contrast. Adaptive optics technology has been employed in various systems to correct these aberrations and restore performance. This has required various departures from the traditional adaptive optics schemes that are used in astronomy. This review discusses the sources of aberrations, their effects and their correction with adaptive optics, particularly in confocal and two-photon microscopes. Different methods of wavefront sensing, indirect aberration measurement and aberration correction devices are discussed. Applications of adaptive optics in the related areas of optical data storage, optical tweezers and micro/nanofabrication are also reviewed.

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Section: Adaptive Optics For Microscopy (A ) Implementations Of Adaptive Optics In Microscopymentioning

confidence: 99%

Adaptive optics in microscopy

Booth

2007

Phil. Trans. R. Soc. A.

428

266

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“…However, the transverse focal shift can be corrected using the method in Ref. 10. Here, the longitudinal focal shift in Fig.2(b) is mainly discussed.…”

Section: Interferometer Pattern With the Focal Shiftmentioning

confidence: 99%

“…Broadly speaking, aberrations cause the spreading of focus both in the lateral plane and, more importantly, an elongation along the optic axis. In the first case, O'Byrne et al proposed by means of a tilting mirror in the transmission path to maintain the position of the focal spot on the detector [10]. In the second one, for fundamental optical reasons, the only satisfactory method for focusing high NA microscope systems, up until now, has been to change the distance between the objective and specimen mechanically.…”

Section: Introductionmentioning

confidence: 99%

Determining the optimal imaging position in tomographic interference microscopy

Lai

2009

SPIE Proceedings

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Tomographic interference microscopy is a method which can obtain the three-dimensional refractive index of live cells and tissues. In this paper, the cone-shaped light with the transverse scanning is adopted, which offers non-contact, highresolution and real-time cell magnifying imaging facilities relatively to the traditional parallel beam projecting on the tissue sample. However, the index-induced focal shift is the common disadvantage for this tomographic interference microscopy, which leads to the decline in image quality and impacts later reconstruction. Then the image sharpness metric based upon the histogram of image to determine the index-induced focal shift is introduced. The experimental results show that the variances of histograms are compatible with a Gaussian function. The peak value of the Gaussian curve corresponds to the optimal imaging position's histogram variance.

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“…However, in a transmission microscope, sample aberrations or wedging may create a poor or nonstationary image of the probe focus, making a transmissive confocal microscope very difficult to implement. 16 As the 3D point spread function for the type 1 microscope has the form of the probe beam intensity pattern, the conservation of power has ramifications for depth sectioning. The total signal contribution from all focal planes must remain equal, and only the frequency response may change.…”

Section: F Optical Depth-sectioning Propertiesmentioning

confidence: 99%

Scanning transmission microscopy using a position-sensitive detector

Ayres

McLeod

2006

Appl. Opt.

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Optical data manipulation technologies increasingly employ densely aperiodic optical 3D phase elements. Refinement of such technologies will require the capability to quantitatively characterize the volumetric dielectric modulation of an optical sample to a high level of precision and spatial resolution. We present a scanning transmission microscopy system that uses a position-sensitive detector to impart sensitivity to both the phase and absorption components. We describe the layout of the instrument and then derive its phase and absorption transfer functions. Simulations and experiments are presented to validate the analysis. For phase detection, the instrument possesses depth-sectioning properties similar to those of a confocal microscope without the use of a pinhole, enabling full 3D object reconstruction.

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Adaptive Optics in Confocal Microscopy

Cited by 7 publications

References 5 publications

Adaptive optics in microscopy

Adaptive optics in microscopy

Determining the optimal imaging position in tomographic interference microscopy

Scanning transmission microscopy using a position-sensitive detector

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