Adaptive Defect Detection Method based on Skewness of the Histogram in LCD Image

Abstract

STD method using a mean and standard deviation is widely used in various inspection systems. The result of detection using the STD method is very dependent on the threshold value. This paper proposes an adaptive defect detection algorithm to with a precise detection of an ultimate defect. The proposed method is determined threshold value adaptively using a skewness that indicates a similarity of intensity and normal distribution of image. In the experiment, we used a various TFT-LCD images for a quantitative evaluation of defect detection performance evaluation result to prove the performance of the proposed algorithm.