Adaptation of solid state detector in X‐Ray powder diffractometry

Laine, E.; Lähteenmäki, I.; Kantola, Markus

doi:10.1002/xrs.1300010304

Cited by 18 publications

(3 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Albritton and Margrave ( 6) have shown that the non-dispersive diffractometer is a rapid and versatile technique for high-temperature-high-pressure study of solids. Martin and Klein (226), and Laine et al (201) have described systems and Lin (210) has described a computer coupled system. The application of energy-dispersive X-ray analysis to thin film analysis was reported by DeBen and Broyde (70).…”

Section: Instrumentationmentioning

confidence: 99%

X-ray diffraction

Pfluger¹

1974

Anal. Chem.

View full text Add to dashboard Cite

This review presents a general overview of the field of X-ray diffraction with emphasis being on the directions in which applications and research in the areas of instrumentation, analysis, powder methods, topographic methods, determination of molecular structure, etc., have been going rather than presenting a comprehensive listing of all references in which X-ray diffraction was utilized. To do so would have been a formidable task as the use of X-ray diffraction methods in solving problems in chemistry, material sciences, geology, industry, etc., is extremely widespread, as becomes evident after even a rather superficial scan of the literature. This review covers the period of January 1972 through December 1973, mainly by the appearance of an abstract during this time, although several

show abstract

Section: Instrumentationmentioning

confidence: 99%

X-ray diffraction

Pfluger¹

1974

Anal. Chem.

View full text Add to dashboard Cite

show abstract

“…EDXRD was developed in the late 1960s (Giessen & Gordon, 1968;Buras et al, 1968) following the advent of solidstate detectors with good energy resolution [specifically, the Si(Li) detector], the key enabling technology. Several studies explored the characteristics of the technique (Ferrell, 1971;Laine et al, 1972;Sparks & Gedcke, 1972;Wilson, 1973;Olsen et al, 1978;Laine & Lä hteenmä ki, 1980), and determined the advantages and drawbacks relative to the conventional and well established ADXRD method. The major benefits of EDXRD are as follows:…”

Section: Introductionmentioning

confidence: 99%

“…Advantage (3) above allows rapid phase identification, and consequently EDXRD is suited to dynamical studies (Mantler, 1981) and for on-stream materials analysis. In many cases, useful diffraction patterns can be obtained on timescales of seconds or minutes (Giessen & Gordon, 1968;Ferrell, 1971;Laine et al, 1972;Sparks & Gedcke, 1972;Voskamp, 1974;Ballirano & Caminiti, 2001;O'Dwyer & Tickner, 2008). In these applications, the materials involved are commonly not structurally complex, leading to relatively simple diffraction patterns and hence obviating the first disadvantage listed above.…”

Section: Introductionmentioning

confidence: 99%

Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology

Hansford¹

2011

J Appl Crystallogr

View full text Add to dashboard Cite

A novel X‐ray diffraction (XRD) technique, which exhibits almost complete insensitivity to the morphology of and distance to the sample, is presented for the first time. This technique applies energy‐dispersive XRD (EDXRD) in a back‐reflection geometry, with 2θ≃ 180°. Although this geometry leads to low resolution of diffraction peaks and the greatest overlap with fluorescence peaks, it nevertheless yields a combination of properties that are unique in the field of X‐ray diffractometry. It is likely that diffraction patterns can be obtained with no or very minimal sample preparation. Furthermore, the intrinsic geometry of the method and the simplicity inherent to EDXRD enables a compact lightweight instrument design, suitable for field‐portable or hand‐held XRD and X‐ray fluorescence analysis. Application to geological and planetary science is emphasized in this paper. The characteristics of the technique are elucidated via theoretical considerations and ray‐trace modelling, and the simplest possible implementation is described.

show abstract

Isotope‐excited X‐ray fluorescence analysis of binary alloys using energy dispersion

Laine

Tukia

1973

X-Ray Spectrometry

View full text Add to dashboard Cite

A radioisotope‐excited X‐ray fluorescence method for the analysis of binary alloys has been presented. In this energy dispersion analysis no standard specimens were needed. The method was applied to copper‐antimony alloys. The results were checked by another energy dispersion method based on X‐ray diffraction. X‐ray photons from the specimen were measured with an Si (Li) detector and a multichannel analyser was used to sort out the energies. The data were recorded on punched paper tape for computer processing.

show abstract

Adaptation of solid state detector in X‐Ray powder diffractometry

Cited by 18 publications

References 6 publications

X-ray diffraction

X-ray diffraction

Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology

Isotope‐excited X‐ray fluorescence analysis of binary alloys using energy dispersion

Contact Info

Product

Resources

About