Acceleration parameters and reliability of SiGe HBTs during long-term high-V&lt;sub&gt;ce&lt;/sub&gt; operation

Rosenthal, P. A.; Paine, B. M.

doi:10.1109/rocs.2008.5483623

2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] 2008

DOI: 10.1109/rocs.2008.5483623

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Acceleration parameters and reliability of SiGe HBTs during long-term high-V<sub>ce</sub> operation

P. A. Rosenthal

B. M. Paine

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Acceleration parameters and reliability of SiGe HBTs during long-term high-V<sub>ce</sub> operation

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References 4 publications

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