2000
DOI: 10.1016/s0168-9002(00)00427-7
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Acceleration of cluster and molecular ions by TIARA 3 MV tandem accelerator

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Cited by 22 publications
(18 citation statements)
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“…A high-intensity C60 ion beam of a hundred pico-ampere level at an energy of 6 MeV can be available using a helium stripper gas and is mainly supplied to develop a highly sensitive surface analysis by means of time of flight mass spectrometry. All ions that form a stable negative ion, including cluster ions such as Cn (n = 2 to 10) and Aun (n = 2 to 4) [19] can be produced by the SNICS II, while negative C60 ions are produced with an electron attachment method originally developed at TIARA [20]. The charge exchange type RF ion source is used exclusively for production of unstable negative helium ions.…”
Section: Three Electrostatic Acclerators and Their Ion Sourcesmentioning
confidence: 99%
“…A high-intensity C60 ion beam of a hundred pico-ampere level at an energy of 6 MeV can be available using a helium stripper gas and is mainly supplied to develop a highly sensitive surface analysis by means of time of flight mass spectrometry. All ions that form a stable negative ion, including cluster ions such as Cn (n = 2 to 10) and Aun (n = 2 to 4) [19] can be produced by the SNICS II, while negative C60 ions are produced with an electron attachment method originally developed at TIARA [20]. The charge exchange type RF ion source is used exclusively for production of unstable negative helium ions.…”
Section: Three Electrostatic Acclerators and Their Ion Sourcesmentioning
confidence: 99%
“…Cluster ion beams in the energy region mentioned above can be provided using a conventional tandem accelerator. The Takasaki Ion Accelerators for Advanced Radiation Application ͑TIARA͒ facility can produce and accelerate B n , C n , Si n , Al n , Ge n , Cu n , Ag n , Au n ͑n Ϲ 10: for carbon͒, 3 and C 60 cluster ions with a 3 MV tandem accelerator at energies of up to 12 MeV ͑C 60 3+ ͒. Some of the applications developed at the TIARA facility have already been reported in Refs.…”
Section: Transmission Of Cluster Ions Through a Tandem Accelerator Ofmentioning
confidence: 99%
“…The ions were injected into the target PC films attached to an aluminum sample holder by double-sided conducting tape. The irradiations were performed at a primary particle fluence rate below 10 11 below 5ϫ10 Ϫ8 Torr, and the incident angle of the beam was normal to the sample surface. A current at the target I t and an emission current by secondary charged particles I s were simultaneously measured by two high-sensitivity electrometers ͑ADVANTEST model 8240͒.…”
Section: Y Kobayashimentioning
confidence: 99%